A statistical RKR fracture model for the brittle fracture of functionally graded materials
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 957-962 |
Journal / Publication | Materials Science Forum |
Volume | 308-311 |
Online published | 17 May 1999 |
Publication status | Published - 1999 |
Externally published | Yes |
Conference
Title | 1998 5th International Symposium on Functionally Graded Materials, FGM '98 |
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Place | Germany |
City | Dresden |
Period | 26 - 29 October 1998 |
Link(s)
Abstract
A statistical Ritchie-Knott-Rice (RKR) [1] model for brittle fracture is considered for an FGM containing a slender notch. The FMG is modeled as linear elastic, with its strength described by two-parameter Weibull statistics. The Young's modulus is assumed to vary either linearly or sigmoidally. A compact tension (C(T)) fracture mechanics specimen is analyzed via the finite element method, considering the effect of modulus variation on the near-tip stress state. Results can be characterized by the stress intensity, K. For spatially constant Weibull parameters, the RKR model is used to predict the expected fracture toughness, KΦ, i.e., the K at which the first flaw failure occurs with probability Φ. For sufficiently high Weibull modulus, the failure occurs essentially at the notch tip. For sufficiently low Weibull modulus (m < 4), KΦ for an FGM is found to vary up to 25% from that of a homogeneous body. © 1999 Trans Tech Publications.
Research Area(s)
- Fracture Mechanics, Fracture Toughness, Statistical Fracture, Weibull Statistics
Citation Format(s)
A statistical RKR fracture model for the brittle fracture of functionally graded materials. / Becker Jr., T. L.; Cannon, R. M.; Ritchie, R. O.
In: Materials Science Forum, Vol. 308-311, 1999, p. 957-962.
In: Materials Science Forum, Vol. 308-311, 1999, p. 957-962.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review