A simple and effective route to annihilate defects in nanocrystalline SnO2 thin films prepared by pulsed laser deposition

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

View graph of relations

Author(s)

Detail(s)

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
Pages48-65
Volume1026
Publication statusPublished - 2008

Publication series

Name
Volume1026
ISSN (Print)0272-9172

Conference

Title2007 MRS Fall Meeting
PlaceUnited States
CityBoston, MA
Period26 - 30 November 2007

Abstract

The microstructural defects of nanocrystalline SnO2 thin films prepared by pulsed laser deposition have been investigated using transmission electron microscopy, high-resolution transmission electron microscopy and Raman spectroscopy. Defects inside nanocrystalline SnO2 thin films could be significantly reduced by annealing the SnO2 thin films at 300°C for 2 h. High-resolution transmission electron microscopy showed that stacking faults and twins were annihilated upon annealing. In particular, the edges of the SnO2 nanoparticles demonstrated perfect lattices free of defects after annealing. Raman spectra also confirmed that annealing the specimen was almost defect-free. By using thermal annealing, defect-free nanocrystalline SnO2 thin films can be prepared in a simple and practical way, which holds promise for applications as transparent electrodes and solid-state gas sensors. © 2008 Materials Research Society.

Research Area(s)

  • Annealing, Defect, Pulsed laser deposition, SnO2, Thin film

Citation Format(s)

A simple and effective route to annihilate defects in nanocrystalline SnO2 thin films prepared by pulsed laser deposition. / Chen, Z. W.; Wu, C. M L; Shek, C. H.; Lai, J. K L; Jiao, Z.; Wu, M. H.

Materials Research Society Symposium Proceedings. Vol. 1026 2008. p. 48-65.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review