A Semisupervised Approach for Industrial Anomaly Detection via Self-Adaptive Clustering
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Article number | 10138120 |
Pages (from-to) | 1687-1697 |
Number of pages | 12 |
Journal / Publication | IEEE Transactions on Industrial Informatics |
Volume | 20 |
Issue number | 2 |
Online published | 29 May 2023 |
Publication status | Published - Feb 2024 |
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Abstract
With the rapid development of the Industrial Internet of Things (IIoT), log-based anomaly detection has become vital for smart industrial construction that has prompted many researchers to contribute. To detect anomalies based on log data, semi-supervised approaches stand out from supervised and unsupervised approaches because they only require a portion of labeled data and are relatively stable. However, the state-of-the-art semi-supervised approaches still suffer from two main problems: manual parameter setting and unsatisfactory performance with high false positives. We propose AdaLog, an integrated semi-supervised approach based on self-adaptive clustering, for industrial anomaly detection. In particular, the clustering step performs automatic label probability estimation by distinguishing twelve situations so that the label probability of each unlabeled data can be carefully calculated, leading to high accuracy. In addition, AdaLog employs a pre-trained model to learn contextual information comprehensively and a transformer-based model to detect anomalies efficiently. To alleviate class imbalance, an undersampling method is incorporated. The results on three popular datasets demonstrate that AdaLog significantly outperforms three state-of-the-art semi-supervised approaches by 17.8%–2,489.8% on average in terms of F1-score, and is even superior to two supervised approaches in most cases with average improvements of 10.9%–23.8%.
© 2023 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
© 2023 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
Research Area(s)
- Intelligent anomaly detection, clustering, transformer, deep learning
Citation Format(s)
A Semisupervised Approach for Industrial Anomaly Detection via Self-Adaptive Clustering. / Ma, Xiaoxue; Keung, Jacky; He, Pinjia et al.
In: IEEE Transactions on Industrial Informatics, Vol. 20, No. 2, 10138120, 02.2024, p. 1687-1697.
In: IEEE Transactions on Industrial Informatics, Vol. 20, No. 2, 10138120, 02.2024, p. 1687-1697.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review