A reliable MTD design for MLC flash-memory storage systems

Yuan-Hao Chang; Tei-Wei Kuo

doi:10.1145/1879021.1879045

A reliable MTD design for MLC flash-memory storage systems

Yuan-Hao Chang
, Tei-Wei Kuo

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

25 Citations (Scopus)

Abstract

The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.

Original language	English
Title of host publication	Proceedings of the tenth ACM international conference on Embedded software
Publisher	Association for Computing Machinery
Pages	179-188
ISBN (Print)	978-1-60558-904-6
DOIs	https://doi.org/10.1145/1879021.1879045
Publication status	Published - Oct 2010
Externally published	Yes
Event	6th Embedded Systems Week 2010, ESWEEK 2010 - 10th ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT'10 - Scottsdale, United States Duration: 24 Oct 2010 → 29 Oct 2010 https://dl.acm.org/doi/proceedings/10.1145/1879021

Publication series

Name	Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT

Conference

Conference	6th Embedded Systems Week 2010, ESWEEK 2010 - 10th ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT'10
Place	United States
City	Scottsdale
Period	24/10/10 → 29/10/10
Internet address	https://dl.acm.org/doi/proceedings/10.1145/1879021

Research Keywords

Bad block
Error correction
Error rate
Error recover
Flash memory
Mirror
MLC
RAID
Reliability
Storage system

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10.1145/1879021.1879045

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Chang, Y.-H., & Kuo, T.-W. (2010). A reliable MTD design for MLC flash-memory storage systems. In Proceedings of the tenth ACM international conference on Embedded software (pp. 179-188). (Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT). Association for Computing Machinery. https://doi.org/10.1145/1879021.1879045

Chang, Yuan-Hao ; Kuo, Tei-Wei. / A reliable MTD design for MLC flash-memory storage systems. Proceedings of the tenth ACM international conference on Embedded software. Association for Computing Machinery, 2010. pp. 179-188 (Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT).

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title = "A reliable MTD design for MLC flash-memory storage systems",

abstract = "The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.",

keywords = "Bad block, Error correction, Error rate, Error recover, Flash memory, Mirror, MLC, RAID, Reliability, Storage system",

author = "Yuan-Hao Chang and Tei-Wei Kuo",

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doi = "10.1145/1879021.1879045",

language = "English",

isbn = "978-1-60558-904-6",

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publisher = "Association for Computing Machinery",

pages = "179--188",

booktitle = "Proceedings of the tenth ACM international conference on Embedded software",

address = "United States",

note = "6th Embedded Systems Week 2010, ESWEEK 2010 - 10th ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT'10 ; Conference date: 24-10-2010 Through 29-10-2010",

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Chang, Y-H & Kuo, T-W 2010, A reliable MTD design for MLC flash-memory storage systems. in Proceedings of the tenth ACM international conference on Embedded software. Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT, Association for Computing Machinery, pp. 179-188, 6th Embedded Systems Week 2010, ESWEEK 2010 - 10th ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT'10, Scottsdale, Arizona, United States, 24/10/10. https://doi.org/10.1145/1879021.1879045

A reliable MTD design for MLC flash-memory storage systems. / Chang, Yuan-Hao; Kuo, Tei-Wei.
Proceedings of the tenth ACM international conference on Embedded software. Association for Computing Machinery, 2010. p. 179-188 (Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - A reliable MTD design for MLC flash-memory storage systems

AU - Chang, Yuan-Hao

AU - Kuo, Tei-Wei

PY - 2010/10

Y1 - 2010/10

N2 - The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.

AB - The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.

KW - Bad block

KW - Error correction

KW - Error rate

KW - Error recover

KW - Flash memory

KW - Mirror

KW - MLC

KW - RAID

KW - Reliability

KW - Storage system

UR - https://www.scopus.com/pages/publications/78650649742

UR - https://www.scopus.com/pages/publications/78650649742#tab=impact

U2 - 10.1145/1879021.1879045

DO - 10.1145/1879021.1879045

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 978-1-60558-904-6

T3 - Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT

SP - 179

EP - 188

BT - Proceedings of the tenth ACM international conference on Embedded software

PB - Association for Computing Machinery

T2 - 6th Embedded Systems Week 2010, ESWEEK 2010 - 10th ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT'10

Y2 - 24 October 2010 through 29 October 2010

ER -

Chang YH, Kuo TW. A reliable MTD design for MLC flash-memory storage systems. In Proceedings of the tenth ACM international conference on Embedded software. Association for Computing Machinery. 2010. p. 179-188. (Embedded Systems Week - Proceedings of the ... ACM International Conference on Compilers, Architecture and Synthesis for Embedded Systems, EMSOFT). doi: 10.1145/1879021.1879045

A reliable MTD design for MLC flash-memory storage systems

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