A reliability model for piezoelectric actuators

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

5 Scopus Citations
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Author(s)

  • Zhimin He
  • Han Tong Loh
  • Min Xie
  • Xiao Guo

Detail(s)

Original languageEnglish
Title of host publication7th International Power Engineering Conference, IPEC2005
Volume2005
Publication statusPublished - 2005
Externally publishedYes

Publication series

Name
Volume2005

Conference

Title7th International Power Engineering Conference, IPEC2005
PlaceSingapore
CitySingapore
Period29 November - 2 December 2005

Abstract

A probabilistic approach is presented for the evaluation of the reliability of piezoelectric micro-actuators that takes into account the effects of both driving voltage and temperature. Based on the relationships between the lifetime and degradation mechanism of piezoelectric actuators and the electric field strength, as well as the actuator working temperature, a two-dimensional probability model for evaluating reliability of piezoelectric micro-actuators is described. The concept of two-dimensional strength is proposed to incorporate the electric driving voltage and the working temperature of the piezoelectric actuators at a specified lifetime. The lifetime (number of cycles to failure) of piezoelectric actuator, electric load and temperature are considered as the random variables and their probability distributions are discussed. A two-dimensional strength probability distribution function is derived. A two-dimensional interference model between the two-dimensional strength and load is also used to derive the reliability expression. Using this approach, the relationship among the reliability, lifetime, driving voltage and temperature can be described analytically. The relationship between reliability and the lifetime of piezoelectric actuator can be obtained. A case study of a piezoelectric micro-actuator used for head positioning in a disk drive head positioning system demonstrates that the two-dimensional probability model can be used for reliability evaluation and lifetime estimation of piezoelectric micro-actuators according to design requirements.

Research Area(s)

  • Electric strength, Fatigue life, Piezoelectric actuators, Probability distribution, Reliability, Temperature, Two-dimensional strength

Citation Format(s)

A reliability model for piezoelectric actuators. / He, Zhimin; Loh, Han Tong; Xie, Min et al.
7th International Power Engineering Conference, IPEC2005. Vol. 2005 2005. 1627332.

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review