A reliability enhancement design under the flash translation layer for MLC-based flash-memory storage systems
- Yuan-Hao Chang
- , Ming-Chang Yang
- , Tei-Wei Kuo
- , Ren-Hung Hwang
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
27
Link opens in a new tab
Citations
(Scopus)