A Path Dependence Identification Method for Power MOSFETs Degradation Due to Bias Temperature Instability

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Computer Science

100
Identification Computer Science
50
Design Computer Science
50
Computation Computer Science
50
Reliability Predict... Computer Science
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Quantitative Evalua... Computer Science
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Traditional Model Computer Science
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Reliability Concern Computer Science
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Physical Condition Computer Science
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Degradation Process Computer Science
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Operational Paramet... Computer Science
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Dependence Analysis Computer Science

Keyphrases

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Identification Meth... Keyphrases
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Power MOSFET Keyphrases
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Path Dependence Keyphrases
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Bias Temperature In... Keyphrases
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MOSFET Keyphrases
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Quantitative Evalua... Keyphrases
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Degradation Process Keyphrases
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Operational Paramet... Keyphrases
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Physical Condition Keyphrases
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Accelerated Degrada... Keyphrases
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Test Design Keyphrases
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Mission Profile Keyphrases
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Degradation Factor Keyphrases
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Reliability Predict... Keyphrases
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Traditional Models Keyphrases
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Stress Interaction Keyphrases
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Test Path Keyphrases
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Path Dependence Ana... Keyphrases
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Silicon MOSFET Keyphrases

INIS

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power INIS
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instability INIS
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mosfet INIS
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reliability INIS
33
design INIS
33
interactions INIS
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evaluation INIS
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silicon INIS
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prediction INIS
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calculation methods INIS
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exercise INIS

Physics

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Temperature Physics
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Field Effect Transi... Physics
66
Independent Variabl... Physics
66
Reliability Physics
33
Silicon Physics
33
Model Physics
33
Calculation Physics
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Evaluation Physics
33
Identifying Physics
33
Physical Exercise Physics

Engineering

100
Temperature Engineering
100
Metal-Oxide-Semicon... Engineering
33
Design Engineering
33
Models Engineering
33
Reliability Engineering
33
Experiments Engineering
33
Quantitative Evalua... Engineering
33
Operational Paramet... Engineering
33
Reliability Predict... Engineering
33
Degradation Process Engineering

Chemical Engineering

100
Temperature Chemical Engineering
50
Silicon Chemical Engineering
Research OutputsResearch Output authored by A Path Dependence Identification Method for Power MOSFETs Degradation Due to Bias Temperature Instability is tagged with the concept