TY - GEN
T1 - A new colour 3D SFS scheme using neural networks and iterative recursive method
AU - Chow, Tommy W.S.
AU - Cho, S. Y.
PY - 2002
Y1 - 2002
N2 - The problem of colour SFS refers to the well-known fact that most real objects usually contain mixtures of diffuse and specular colour reflections and are affected by the multi-coloured interreflection under unknown reflectivity. In this paper, a novel colour SFS scheme is proposed. The proposed approach focuses on two main parts. First, a generalized neural based colour reflectance model is described. Second, an iterative recursive method is developed to reconstruct a multi-colour 3D surface. Experimental results on synthetic coloured objects were performed and compared with other well-known conventional models. The obtained results demonstrate that the performance of the proposed methodology is very encouraging.
AB - The problem of colour SFS refers to the well-known fact that most real objects usually contain mixtures of diffuse and specular colour reflections and are affected by the multi-coloured interreflection under unknown reflectivity. In this paper, a novel colour SFS scheme is proposed. The proposed approach focuses on two main parts. First, a generalized neural based colour reflectance model is described. Second, an iterative recursive method is developed to reconstruct a multi-colour 3D surface. Experimental results on synthetic coloured objects were performed and compared with other well-known conventional models. The obtained results demonstrate that the performance of the proposed methodology is very encouraging.
UR - http://www.scopus.com/inward/record.url?scp=0036954628&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0036954628&origin=recordpage
U2 - 10.1109/IECON.2002.1185253
DO - 10.1109/IECON.2002.1185253
M3 - RGC 32 - Refereed conference paper (with host publication)
VL - 3
SP - 1854
EP - 1859
BT - IECON Proceedings (Industrial Electronics Conference)
T2 - Proceedings of the 2002 28th Annual Conference of the IEEE Industrial Electronics Society
Y2 - 5 November 2002 through 8 November 2002
ER -