TY - GEN
T1 - A New Clock-feedthrough Cancellation Method for Second-Generation Switched-Current Circuits
AU - Tse, C. K.
AU - Chow, M. H. L.
PY - 1995/4
Y1 - 1995/4
N2 - In second-generation switched-current circuits, the effect of charge injection, which manifests itself as clock-feedthrough, seriously affects the accuracy of the sampling operation which is required by any sampled-data system. In this paper a new method is proposed to tackle the problem of clock-feedthrough in the second-generation circuits. This method is based on the use of a 'dummy circuit' which superposes the same amount of error in the opposite direction. The technique can be applied to the any second-generation cell such as the current memory and the delay cell. SPICE simulations are performed which verify the feasibility of the proposed technique in cancelling clock-feedthrough effects.
AB - In second-generation switched-current circuits, the effect of charge injection, which manifests itself as clock-feedthrough, seriously affects the accuracy of the sampling operation which is required by any sampled-data system. In this paper a new method is proposed to tackle the problem of clock-feedthrough in the second-generation circuits. This method is based on the use of a 'dummy circuit' which superposes the same amount of error in the opposite direction. The technique can be applied to the any second-generation cell such as the current memory and the delay cell. SPICE simulations are performed which verify the feasibility of the proposed technique in cancelling clock-feedthrough effects.
UR - http://www.scopus.com/inward/record.url?scp=0029191237&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0029191237&origin=recordpage
U2 - 10.1109/iscas.1995.523840
DO - 10.1109/iscas.1995.523840
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 0780325702
VL - 3
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 2104
EP - 2107
BT - Proceedings of ISCAS'95 - International Symposium on Circuits and Systems
T2 - 1995 IEEE International Symposium on Circuits and Systems (ISCAS 1995)
Y2 - 30 April 1995 through 3 May 1995
ER -