A New Clock-feedthrough Cancellation Method for Second-Generation Switched-Current Circuits

C. K. Tse, M. H. L. Chow

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

6 Citations (Scopus)

Abstract

In second-generation switched-current circuits, the effect of charge injection, which manifests itself as clock-feedthrough, seriously affects the accuracy of the sampling operation which is required by any sampled-data system. In this paper a new method is proposed to tackle the problem of clock-feedthrough in the second-generation circuits. This method is based on the use of a 'dummy circuit' which superposes the same amount of error in the opposite direction. The technique can be applied to the any second-generation cell such as the current memory and the delay cell. SPICE simulations are performed which verify the feasibility of the proposed technique in cancelling clock-feedthrough effects.
Original languageEnglish
Title of host publicationProceedings of ISCAS'95 - International Symposium on Circuits and Systems
Pages2104-2107
Volume3
DOIs
Publication statusPublished - Apr 1995
Externally publishedYes
Event1995 IEEE International Symposium on Circuits and Systems (ISCAS 1995) - Seattle, United States
Duration: 30 Apr 19953 May 1995

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISSN (Print)0271-4310

Conference

Conference1995 IEEE International Symposium on Circuits and Systems (ISCAS 1995)
PlaceUnited States
CitySeattle
Period30/04/953/05/95

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