A multi-level sketch-based interface for decorative pattern exploration

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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Detail(s)

Original languageEnglish
Title of host publicationSA 2016 - SIGGRAPH ASIA 2016 Technical Briefs
PublisherAssociation for Computing Machinery, Inc
ISBN (Print)9781450345415
StatePublished - 28 Nov 2016

Conference

Title2016 SIGGRAPH ASIA Technical Briefs, SA 2016
PlaceChina
CityMacau
Period5-8 December 2016

Link(s)

Abstract

Despite the extensive usage of decorative patterns in art and design, there is a lack of intuitive ways to find a certain type of patterns. In this paper, we present a multi-level sketch-based interface that incorporates low-level geometrical features and high-level structural features, namely reflection, rotation, and translation symmetries, to support decorative pattern exploration at different levels of detail. Four brush tools are designed for users to specify any combination of such features and compose a hybrid search query. The results of a pilot study show that users are able to perform pattern retrieval tasks using our system easily and effectively.

Research Area(s)

  • Decorative patterns, Sketch-based image retrieval, Symmetry

Bibliographic Note

Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).

Citation Format(s)

A multi-level sketch-based interface for decorative pattern exploration. / Chen, Yilan; Fu, Hongbo; Au, Kin Chung.

SA 2016 - SIGGRAPH ASIA 2016 Technical Briefs. Association for Computing Machinery, Inc, 2016. 26.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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