Abstract
Despite the extensive usage of decorative patterns in art and design, there is a lack of intuitive ways to find a certain type of patterns. In this paper, we present a multi-level sketch-based interface that incorporates low-level geometrical features and high-level structural features, namely reflection, rotation, and translation symmetries, to support decorative pattern exploration at different levels of detail. Four brush tools are designed for users to specify any combination of such features and compose a hybrid search query. The results of a pilot study show that users are able to perform pattern retrieval tasks using our system easily and effectively.
| Original language | English |
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| Title of host publication | SA 2016 - SIGGRAPH ASIA 2016 Technical Briefs |
| Publisher | Association for Computing Machinery |
| ISBN (Print) | 9781450345415 |
| DOIs | |
| Publication status | Published - Dec 2016 |
| Event | 2016 SIGGRAPH ASIA Technical Briefs, SA 2016 - Macau, China Duration: 5 Dec 2016 → 8 Dec 2016 https://sa2016.siggraph.org/en/ (sa2016.siggraph) https://sa2016.siggraph.org/en/ (SIGGRAPH Asia 2016) |
Conference
| Conference | 2016 SIGGRAPH ASIA Technical Briefs, SA 2016 |
|---|---|
| Place | China |
| City | Macau |
| Period | 5/12/16 → 8/12/16 |
| Internet address |
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Bibliographical note
Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).Research Keywords
- Decorative patterns
- Sketch-based image retrieval
- Symmetry
Publisher's Copyright Statement
- COPYRIGHT TERMS OF DEPOSITED POSTPRINT FILE: © Chen, Y., Fu, H., & Au, K. C. | ACM 2016. This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in SA'16 SIGGRAPH ASIA 2016 Technical Briefs, http://dx.doi.org/10.1145/3005358.3005362