A model for residual life prediction based on Brownian motion with an adaptive drift

Wenbin Wang*, Matthew Carr, Wenjia Xu, Khairy Kobbacy

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

205 Citations (Scopus)

Abstract

A degradation model is presented in this paper for the prediction of the residual life using an adapted Brownian motion-based approach with a drifting parameter. This model differs from other Brownian motion-based approaches in that the drifting parameter of the degradation process is adapted to the history of monitored information. This adaptation is performed by Kalman filtering. We also use a threshold distribution instead of the usual single threshold line which is sometime difficult to obtain in practice. We demonstrate the model using some examples and show that the model performs reasonably well and has a better prediction ability than the standard Brownian motion-based model. The model is then fitted to the data generated from a simulator using the expectation-maximization algorithm. We also fit a standard Brownian motion-based model to the same data to compare the difference and performance. The result shows that the adapted model performs better in terms of certain test statistics and the total mean square errors.

Original languageEnglish
Pages (from-to)285-293
JournalMicroelectronics and Reliability
Volume51
Issue number2
Online published16 Oct 2010
DOIs
Publication statusPublished - Feb 2011
Event2010 Reliability of Compound Semiconductors Workshop (2010 ROCS) - Portland, United States
Duration: 17 May 201017 May 2010

Funding

The work described in this paper was partially supported by a grant from the Research Grants Council of the Hong Kong Special Administrative Region, China (CityU8/CRF/09), and partially by National Natural Science Foundation of China under grant No. 71071097.

Research Keywords

  • CONDITION-BASED MAINTENANCE
  • DIAGNOSTICS

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