A model for 〈c+a〉 dislocation transmission across nano-spaced parallel basal stacking faults in a HCP alloy
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 58-66 |
Journal / Publication | Philosophical Magazine Letters |
Volume | 95 |
Issue number | 1 |
Online published | 16 Feb 2015 |
Publication status | Published - 2015 |
Externally published | Yes |
Link(s)
Abstract
We develop a model for recently observed 〈c + a〉 dislocation transmission across nano-spaced parallel basal stacking faults in hexagonal close-packed (HCP) Mg microcrystalline grains. The model theoretically predicts nanospace-dependent yield strength that is in good agreement with experimental data. Additionally, it theoretically predicts activation volume and strain rate sensitivity.
Research Area(s)
- flow stress, nano-structure, plastic deformation, stacking fault
Citation Format(s)
A model for 〈c+a〉 dislocation transmission across nano-spaced parallel basal stacking faults in a HCP alloy. / Gu, Pei; Zhu, Yuntian; Mathaudhu, Suveen N.
In: Philosophical Magazine Letters, Vol. 95, No. 1, 2015, p. 58-66.
In: Philosophical Magazine Letters, Vol. 95, No. 1, 2015, p. 58-66.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review