A Hybrid Model and Data-Driven Approach for Online Diagnosis of Open-Circuit Faults in Grid-Tied Three-Phase VSIs

Siqi Lai, Guipeng Chen, Zhennan She, Liping Mo, Xinlin Qing

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

1 Citation (Scopus)

Abstract

This paper proposes a hybrid method for diagnosing single and multiple transistor open-circuit faults in grid-tied three-phase voltage source inverters. Combining explicit variable relationships in analytical models with the nonlinear regression capability of neural networks, the method comprises offline model training and online fault diagnosis sections. The offline section constructs a neural network model based on analytical model variables, using closed-loop system samples to predict fault characteristics. In the online part, the predictive model is applied to the Simulink online simulation platform. Real-time predictions and auxiliary signals enable online diagnosis of open-circuit faults, ensuring rapid diagnosis without additional hardware circuitry, addressing challenges like computational intensity, difficult threshold selection, and complex rule formulation. Simulation results validate the method's excellent performance. © 2024 IEEE.
Original languageEnglish
Title of host publicationICIT 2024 - The 2024 International Conference on Industrial Technology (ICIT)
PublisherIEEE
ISBN (Electronic)979-8-3503-4026-6
DOIs
Publication statusPublished - 2024
Event25th IEEE International Conference on Industrial Technology, ICIT 2024 - Bristol, United Kingdom
Duration: 25 Mar 202427 Mar 2024

Publication series

NameProceedings of the IEEE International Conference on Industrial Technology
ISSN (Print)2641-0184
ISSN (Electronic)2643-2978

Conference

Conference25th IEEE International Conference on Industrial Technology, ICIT 2024
PlaceUnited Kingdom
CityBristol
Period25/03/2427/03/24

Research Keywords

  • data-driven
  • fault diagnosis
  • grid-tied three-phase voltage-source inverters (VSI)
  • model-driven
  • nonlinear regression
  • open-circuit (OC) fault

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