TY - GEN
T1 - A Highly Sensitive Flexible Piezoresistive Sensor Based on Wrinkled CNT-PDMS
AU - Miao, Li-Ming
AU - Meng, Bo
AU - Wan, Ji
AU - Chen, Hao-Tian
AU - Cheng, Xiao-Liang
AU - Song, Yu
AU - Guo, Hang
AU - Zhang, Hai-Xia
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2018/12/3
Y1 - 2018/12/3
N2 - This paper presents a highly sensitive flexible piezoresistive sensor based on wrinkled structure. By adding carbon nanotube(CNT) into the mixing of polydimethylsiloxane(PDMS), conductive PDMS can be fabricated. Patterned with monolayer wrinkle structure, this stretchable CNT PDMS can be used as a thin and flexible pressure sensor. The wrinkle structure enables the sensor with high sensitivity (8.3 kPa-1) in low pressure region(0.01kPa). In addition, the result of force image test shows that the sensor array can be used into detecting pressure distribution and measuring force images. © 2018 IEEE.
AB - This paper presents a highly sensitive flexible piezoresistive sensor based on wrinkled structure. By adding carbon nanotube(CNT) into the mixing of polydimethylsiloxane(PDMS), conductive PDMS can be fabricated. Patterned with monolayer wrinkle structure, this stretchable CNT PDMS can be used as a thin and flexible pressure sensor. The wrinkle structure enables the sensor with high sensitivity (8.3 kPa-1) in low pressure region(0.01kPa). In addition, the result of force image test shows that the sensor array can be used into detecting pressure distribution and measuring force images. © 2018 IEEE.
UR - https://www.scopus.com/pages/publications/85060278394
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85060278394&origin=recordpage
U2 - 10.1109/NEMS.2018.8556923
DO - 10.1109/NEMS.2018.8556923
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 9781538652732
T3 - NEMS 2018 - 13th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems
SP - 557
EP - 561
BT - NEMS 2018 - 13th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems
PB - IEEE
T2 - 13th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2018
Y2 - 22 April 2018 through 26 April 2018
ER -