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A convolutional neural network-based patent image retrieval method for design ideation

Shuo Jiang*, Jianxi Luo, Guillermo Ruiz Pava, Jie Hu, Christopher L. Magee

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

The patent database is often used in searches of inspirational stimuli for innovative design opportunities because of its large size, extensive variety and rich design information in patent documents. However, most patent mining research only focuses on textual information and ignores visual information. Herein, we propose a convolutional neural network (CNN)-based patent image retrieval method. The core of this approach is a novel neural network architecture named Dual-VGG that is aimed to accomplish two tasks: visual material type prediction and international patent classification (IPC) class label prediction. In turn, the trained neural network provides the deep features in the image embedding vectors that can be utilized for patent image retrieval and visual mapping. The accuracy of both training tasks and patent image embedding space are evaluated to show the performance of our model. This approach is also illustrated in a case study of robot arm design retrieval. Compared to traditional keyword-based searching and Google image searching, the proposed method discovers more useful visual information for engineering design. © 2020 ASME.
Original languageEnglish
Title of host publicationASME 2020 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
PublisherAmerican Society of Mechanical Engineers
Volume9: 40th Computers and Information in Engineering Conference (CIE)
ISBN (Print)9780791883983
DOIs
Publication statusPublished - 2020
Externally publishedYes
EventASME 2020 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference (IDETC-CIE 2020) - Virtual
Duration: 17 Aug 202019 Aug 2020

Publication series

NameInternational Design Engineering Technical Conferences and Computers and Information in Engineering Conference

Conference

ConferenceASME 2020 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference (IDETC-CIE 2020)
Period17/08/2019/08/20

Research Keywords

  • Convolutional neural network
  • Design ideation
  • Image retrieval
  • Patent analysis

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