A chemical sensor based on the measurement of differential phase related to surface plasmon resonance

H. P. Ho; W. W. Lam; S. Y. Wu; M. Yang

doi:10.1109/HKEDM.2001.946917

A chemical sensor based on the measurement of differential phase related to surface plasmon resonance

H. P. Ho^*
, W. W. Lam
, S. Y. Wu
, M. Yang

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

5 Citations (Scopus)

Abstract

The optical phase change associated with the surface plasmon resonance (SPR) effect that exists in a glass-metal-dielectric stack has been studied using a differential phase imaging technique. A typical prism-coupled SPR setup was constructed and a Mach-Zehnder interferometer was used to perform interferometric analysis between the two orthogonal polarizations in the exit beam. By stepping the phase of the reference arm, one can measure the phase change caused by the SPR effect. Since the reference and signal beams traverse identical optical paths, we expect that this scheme can be more robust in terms of noise immunity. The interrogation area can be enlarged to enable imaging of the SPR sensing surface. Initial phase measurements obtained from a salt-water mixture will be presented to demonstrate the operation of the technique. © 2001 IEEE

Original language	English
Title of host publication	Proceedings 2001 IEEE Hong Kong Electron Devices Meeting
Publisher	IEEE
Pages	56-59
ISBN (Print)	0-7803-6714-6
DOIs	https://doi.org/10.1109/HKEDM.2001.946917
Publication status	Published - Jun 2001
Event	2001 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China Duration: 30 Jun 2001 → 30 Jun 2001

Conference

Conference	2001 IEEE Hong Kong Electron Devices Meeting
Place	China
City	Hong Kong
Period	30/06/01 → 30/06/01

Access Output

10.1109/HKEDM.2001.946917

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@inproceedings{2b4179a5a7504117a570e76912dd0fec,

title = "A chemical sensor based on the measurement of differential phase related to surface plasmon resonance",

abstract = "The optical phase change associated with the surface plasmon resonance (SPR) effect that exists in a glass-metal-dielectric stack has been studied using a differential phase imaging technique. A typical prism-coupled SPR setup was constructed and a Mach-Zehnder interferometer was used to perform interferometric analysis between the two orthogonal polarizations in the exit beam. By stepping the phase of the reference arm, one can measure the phase change caused by the SPR effect. Since the reference and signal beams traverse identical optical paths, we expect that this scheme can be more robust in terms of noise immunity. The interrogation area can be enlarged to enable imaging of the SPR sensing surface. Initial phase measurements obtained from a salt-water mixture will be presented to demonstrate the operation of the technique. {\textcopyright} 2001 IEEE",

author = "Ho, \{H. P.\} and Lam, \{W. W.\} and Wu, \{S. Y.\} and M. Yang",

year = "2001",

month = jun,

doi = "10.1109/HKEDM.2001.946917",

language = "English",

isbn = "0-7803-6714-6",

pages = "56--59",

booktitle = "Proceedings 2001 IEEE Hong Kong Electron Devices Meeting",

publisher = "IEEE",

address = "United States",

note = "2001 IEEE Hong Kong Electron Devices Meeting ; Conference date: 30-06-2001 Through 30-06-2001",

}

A chemical sensor based on the measurement of differential phase related to surface plasmon resonance. / Ho, H. P.; Lam, W. W.; Wu, S. Y. et al.
Proceedings 2001 IEEE Hong Kong Electron Devices Meeting. IEEE, 2001. p. 56-59.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - A chemical sensor based on the measurement of differential phase related to surface plasmon resonance

AU - Ho, H. P.

AU - Lam, W. W.

AU - Wu, S. Y.

AU - Yang, M.

PY - 2001/6

Y1 - 2001/6

N2 - The optical phase change associated with the surface plasmon resonance (SPR) effect that exists in a glass-metal-dielectric stack has been studied using a differential phase imaging technique. A typical prism-coupled SPR setup was constructed and a Mach-Zehnder interferometer was used to perform interferometric analysis between the two orthogonal polarizations in the exit beam. By stepping the phase of the reference arm, one can measure the phase change caused by the SPR effect. Since the reference and signal beams traverse identical optical paths, we expect that this scheme can be more robust in terms of noise immunity. The interrogation area can be enlarged to enable imaging of the SPR sensing surface. Initial phase measurements obtained from a salt-water mixture will be presented to demonstrate the operation of the technique. © 2001 IEEE

AB - The optical phase change associated with the surface plasmon resonance (SPR) effect that exists in a glass-metal-dielectric stack has been studied using a differential phase imaging technique. A typical prism-coupled SPR setup was constructed and a Mach-Zehnder interferometer was used to perform interferometric analysis between the two orthogonal polarizations in the exit beam. By stepping the phase of the reference arm, one can measure the phase change caused by the SPR effect. Since the reference and signal beams traverse identical optical paths, we expect that this scheme can be more robust in terms of noise immunity. The interrogation area can be enlarged to enable imaging of the SPR sensing surface. Initial phase measurements obtained from a salt-water mixture will be presented to demonstrate the operation of the technique. © 2001 IEEE

UR - https://www.scopus.com/pages/publications/0034835327

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0034835327&origin=recordpage

U2 - 10.1109/HKEDM.2001.946917

DO - 10.1109/HKEDM.2001.946917

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 0-7803-6714-6

SP - 56

EP - 59

BT - Proceedings 2001 IEEE Hong Kong Electron Devices Meeting

PB - IEEE

T2 - 2001 IEEE Hong Kong Electron Devices Meeting

Y2 - 30 June 2001 through 30 June 2001

ER -

A chemical sensor based on the measurement of differential phase related to surface plasmon resonance

Abstract

Conference

Access Output

Other Access Options

Permanent Link

Other Files and Links

Fingerprint

Cite this