A Broadband, Via-Less, and Reusable Characterization Method for Advanced Packaging Materials with Multimode Gap Waveguide Resonator

Xiao Xuan Song, Ya Fei Wu*, Yongxin Guo, Yu Jian Cheng

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

1 Citation (Scopus)

Abstract

A broadband, via-less, and reusable multimode resonant complex permittivity measurement method for advanced packaging materials based on gap waveguide is presented in this paper. By feeding energy from a standard rectangular waveguide of W-band through a coupling slot at both ends of a gap waveguide resonator, the quasi-TE10k mode is excited at different frequencies inside the resonator. The gap waveguide resonator is properly designed for operating frequency and multimode measurement. And the complex permittivity can be extracted from the resonant frequency and quality factor of the resonator. The calibration for electromagnetic band gap (EBG) leakage, metal loss, and processing errors can also be achieved by measuring the Sparameter of the resonator without the dielectric film. An example of 100 um thick polyimide (PI) characterization is given. © 2022 IEEE.
Original languageEnglish
Title of host publicationIEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP 2022) - Proceedings
PublisherIEEE
Number of pages3
ISBN (Electronic)9781665478342
ISBN (Print)9781665478359
DOIs
Publication statusPublished - Nov 2022
Externally publishedYes
Event2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP 2022) - Guangzhou, China
Duration: 12 Dec 202214 Dec 2022

Publication series

NameIEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP - Proceedings
ISSN (Print)2766-9564
ISSN (Electronic)2694-2992

Conference

Conference2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP 2022)
Abbreviated titleIEEE MTT-S IMWS-AMP 2022
PlaceChina
CityGuangzhou
Period12/12/2214/12/22

Research Keywords

  • broadband measurement
  • dielectric constant
  • dielectric loss tangent
  • gap waveguide
  • multimode measurement
  • via-less

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