A 126 μ W Readout Circuit in 65 nm CMOS with Successive Approximation-Based Thresholding for Domain Wall Magnet-Based Random Number Generator
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 9032121 |
Pages (from-to) | 7810-7818 |
Journal / Publication | IEEE Sensors Journal |
Volume | 20 |
Issue number | 14 |
Online published | 11 Mar 2020 |
Publication status | Published - 15 Jul 2020 |
Externally published | Yes |
Link(s)
Abstract
We present a novel readout circuit for a ferromagnetic Hall cross-bar based random number generator.
The random orientation of magnetic domains are result of
anomalous Hall-effect. These ferromagnetic Hall cross-bar
structures can be integrated with the read out circuit to
form a plug and play random number generator. The system
can resolve up to 15–20 µ V Hall-voltages from Hall probe.
Application of current densities around 1012A/m2 through the
Ferromagnetic Hall cross-bar produces random Hall-voltage
on the output terminals. To amplify the weak Hall-voltages
(10–100 µ V) in the presence of DC offsets, a modulation
scheme is used to up-convert the signal and a band-pass
amplifier is used to amplify the modulated signal. The bandpass amplifier circuit, motivated by neural recording amplifier is designed in 65nm CMOS and consumes 126 µ W of power
from a 1.2 V supply. Further, we present a successive approximation algorithm and its embedded implementation to set
the desired threshold for digitizing the amplified Hall-voltage in presence of signal drift. Experimental results show that
the resulting system can tolerate drifts in voltage up to 440 µ V.
Research Area(s)
- low-noise amplifiers, low-power electronics, Random number generation, spintronics, very large scale integration
Citation Format(s)
A 126 μ W Readout Circuit in 65 nm CMOS with Successive Approximation-Based Thresholding for Domain Wall Magnet-Based Random Number Generator. / Narasimman, Govind; Basu, Joydeep; Sethi, Pankaj et al.
In: IEEE Sensors Journal, Vol. 20, No. 14, 9032121, 15.07.2020, p. 7810-7818.
In: IEEE Sensors Journal, Vol. 20, No. 14, 9032121, 15.07.2020, p. 7810-7818.
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review