30 nm resolution x-ray imaging at 8 keV using third order diffraction of a zone plate lens objective in a transmission microscope

Gung-Chian Yin*, Yen-Fang Song, Mau-Tsu Tang, Fu-Rong Chen, Keng S. Liang, Frederick W. Duewer, Michael Feser, Wenbing Yun, Han-Ping D. Shieh

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

116 Citations (Scopus)

Abstract

A hard x-ray transmission microscope with 30 nm spatial resolution has been developed employing the third diffraction order of a zone plate objective. The microscope utilizes a capillary type condenser with suitable surface figure to generate a hollow cone illumination which is matched in illumination range to the numerical aperture of the third order diffraction of a zone plate with an outmost zone width of 50 nm. Using a test sample of a 150 nm thick gold spoke pattern with finest half-pitch of 30 nm, the authors obtained x-ray images with 30 nm resolution at 8 keV x-ray energy.
Original languageEnglish
Article number221122
JournalApplied Physics Letters
Volume89
Issue number22
DOIs
Publication statusPublished - 27 Nov 2006
Externally publishedYes

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