Abstract
It is difficult to evaluate the storage life of optical fiber connectors under alternating
temperature, a life evaluation method under modified Coffin-Manson model is proposed. Firstly, the
storage failure mode and mechanism of optical fiber connector are analyzed. Then, the temperature
cycle accelerated degradation test of optical fiber connector under multiple accelerated stress
levels is carried out, and the power function degradation trajectory model is established based on
the insertion loss accelerated degradation data. Then, combined with the failure threshold, the
pseudo failure life at different accelerated stress levels is determined. Through the hypothesis
test, it is deduced that the pseudo failure life of optical fiber connector at each stress level
follows the normal distribution. Finally, the modified Coffin-Manson acceleration model is introduced
to extrapolate the storage life of optical fiber connectors. The storage life of an optical fiber
connector evaluated by this method under the actual stress level is close to the actual storage life,
which verifies the effectiveness and feasibility of the method.
| Translated title of the contribution | Storage Life Evaluation of Optical Fiber Connectors Under Temperature Cycle Acceleration Degradation Test |
|---|---|
| Original language | Chinese (Simplified) |
| Journal | 环境技术 |
| Issue number | 2 |
| Online published | 25 Feb 2024 |
| Publication status | Published - 2024 |
Research Keywords
- 光纤连接器
- 寿命
- 修正 Coffin-Manson 模型
- 温度循环试验
- 加速退化试验
- optical fiber connector
- storage life
- modified coffin manson model
- temperature cycling test
- accelerated degradation test