Dr. WEI Zhengyuan (韋政源)

CrossCert: A Cross-Checking Detection Approach to Patch Robustness Certification for Deep Learning Models

ZHOU, Q., WEI, Z., WANG, H., JIANG, B. & CHAN, W.-K., Jul 2024, Proceedings of the ACM on Software Engineering. Baresi, L. (ed.). New York, NY: Association for Computing Machinery, p. 2725-2746 22 p. (Proceedings of the ACM on Software Engineering; vol. 1, no. FSE).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

A Majority Invariant Approach to Patch Robustness Certification for Deep Learning Models

Zhou, Q., Wei, Z., Wang, H. & Chan, W. K., 2023, Proceedings - 2023 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023. Institute of Electrical and Electronics Engineers, Inc., p. 1790-1794 (Proceedings - IEEE/ACM International Conference on Automated Software Engineering, ASE).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Scopus citations: 1

Aster: Encoding Data Augmentation Relations into Seed Test Suites for Robustness Assessment and Fuzzing of Data-Augmented Deep Learning Models

Wang, H., Wei, Z., Zhou, Q., Jiang, B. & Chan, W. K., 2023, Proceedings - 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security: QRS 2023. Institute of Electrical and Electronics Engineers, Inc., p. 370-381 (IEEE International Conference on Software Quality, Reliability and Security, QRS).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Predictive Mutation Analysis of Test Case Prioritization for Deep Neural Networks

Wei, Z., Wang, H., Ashraf, I. & Chan, W. K., 2022, Proceedings - 2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS 2022). Institute of Electrical and Electronics Engineers, Inc., p. 682-693 10062402

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Scopus citations: 6

SEbox4DL: A Modular Software Engineering Toolbox for Deep Learning Models

Wei, Z., Wang, H., Yang, Z. & Chan, W. K., 2022, 2022 IEEE/ACM 44th International Conference on Software Engineering: Companion Proceedings: ICSE-Companion 2022. Institute of Electrical and Electronics Engineers, Inc., p. 193-196

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Scopus citations: 2

Fuzzing Deep Learning Models against Natural Robustness with Filter Coverage

Wei, Z. & Chan, W. K., Dec 2021, PROCEEDINGS - 2021 21st International Conference on Software Quality, Reliability and Security: — QRS 2021 — . Institute of Electrical and Electronics Engineers, Inc., p. 608-619

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Scopus citations: 3

A Multi-Modal Transformer-based Code Summarization Approach for Smart Contracts

Yang, Z., Keung, J., Yu, X., Gu, X., Wei, Z., Ma, X. & Zhang, M., 2021, Proceedings - 2021 IEEE/ACM 29th International Conference on Program Comprehension: ICPC 2021. Institute of Electrical and Electronics Engineers, Inc., p. 1-12 12 p. 9463060. (IEEE International Conference on Program Comprehension).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Scopus citations: 58

BlockRace: A Big Data Approach to Dynamic Block-based Data Race Detection for Multithreaded Programs

Mei, X., Wei, Z., Zhang, H. & Chan, W. K., Jul 2020, Proceedings - 2020 IEEE/ACM 1st International Conference on Automation of Software Test (AST 2020). Association for Computing Machinery, p. 71-80 (Proceedings - IEEE/ACM 1st International Conference on Automation of Software Test, AST ).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review