Prof. Way KUO (郭位)

Research Output

  1. 2006
  2. Charge trapping and dielectric relaxation in connection with breakdown of high-k gate dielectric stacks

    Luo, W., Yuan, T., Kuo, Y., Lu, J., Yan, J. & Kuo, W., 15 May 2006, In: Applied Physics Letters. 88, 20, 202904.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 17
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  3. Assessment for U.S. engineering programs

    Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 1-6

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  4. Multi-path heuristic for redundancy allocation: The tree heuristic

    Ha, C. & Kuo, W., Mar 2006, In: IEEE Transactions on Reliability. 55, 1, p. 37-43

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 15
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  5. Breakdown phenomena of zirconium-doped hafnium oxide high-k stack with an inserted interface layer

    Luo, W., Yuan, T., Kuo, Y., Lu, J., Yan, J. & Kuo, W., 2006, In: Applied Physics Letters. 89, 7, 72901.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 31
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  6. Modeling and Analyzing Yield, Burn-In and Reliability for Semiconductor Manufacturing: Overview

    Kuo, W., Kim, K. & Kim, T., 2006, Springer Handbooks. Springer, p. 153-169 (Springer Handbooks).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)12_Chapter in an edited book (Author)peer-review

    Scopus citations: 2
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  7. Optimal Reliability Design: Fundamentals and Applications

    Kuo, W., Prasad, V. R., Tillman, F. A. & Hwang, C., 2006, 2nd ed. Cambridge: Cambridge University Press. 412 p.

    Research output: Scholarly Books, Monographs, Reports and Case Studies (RGC: 11, 13, 14, 48, 49)11_Research book or monograph (Author)peer-review

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  8. 2005
  9. On the relationship of semiconductor yield and reliability

    Kim, K. O., Zuo, M. J. & Kuo, W., Aug 2005, In: IEEE Transactions on Semiconductor Manufacturing. 18, 3, p. 422-429

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 13
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  10. Some considerations on system burn-in

    Kim, K. O. & Kuo, W., Jun 2005, In: IEEE Transactions on Reliability. 54, 2, p. 207-214

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 18
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  11. Multi-path approach for reliability-redundancy allocation using a scaling method

    Ha, C. & Kuo, W., May 2005, In: Journal of Heuristics. 11, 3, p. 201-217

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 21
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  12. 2004
  13. Dielectric relaxation and breakdown detection of doped tantalum oxide high-k thin films

    Luo, W., Kuo, Y. & Kuo, W., Sep 2004, In: IEEE Transactions on Device and Materials Reliability. 4, 3, p. 488-493

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 44
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  14. Two-level burn-in for reliability and economy in repairable series systems having incompatibility

    Kim, K. O. & Kuo, W., Sep 2004, In: International Journal of Reliability, Quality and Safety Engineering. 11, 3, p. 197-211

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 6
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  15. A unified model Incorporating yield, burn-in, and reliability

    Kim, K. O. & Kuo, W., Aug 2004, In: Naval Research Logistics. 51, 5, p. 704-719

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 12
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  16. Optimal allocation of minimal and perfect repairs under resource constraints

    Cui, L., Kuo, W., Loh, H. T. & Xie, M., Jun 2004, In: IEEE Transactions on Reliability. 53, 2, p. 193-199

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 58
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  17. A relation model of gate oxide yield and reliability

    Kim, K. O., Kuo, W. & Luo, W., Mar 2004, In: Microelectronics Reliability. 44, 3, p. 425-434

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 23
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  18. Bayesian approach to reliability projection for high k dielectric thin films

    Luo, W., Kuo, W. & Kuo, Y., 2004, IEEE International Integrated Reliability Workshop Final Report. p. 186-187

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 2
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  19. 2003
  20. Published

    IEEE Transactions on Reliability: Editor's Note

    Kuo, W., Dec 2003, In: IEEE Transactions on Reliability. 52, 4

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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  21. Percentile life and reliability as performance measures in optimal system design

    Kim, K. O. & Kuo, W., Dec 2003, In: IIE Transactions (Institute of Industrial Engineers). 35, 12, p. 1133-1142

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 27
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  22. A general model of heterogeneous system lifetimes and conditions for system burn-in

    Kim, K. O. & Kuo, W., Jun 2003, In: Naval Research Logistics. 50, 4, p. 364-380

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 16
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  23. An Assessment Framework for Optimal FMS Effectiveness

    RUPE, J. & KUO, W., Apr 2003, In: International Journal of Flexible Manufacturing Systems. 15, 2, p. 151-165

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  24. The direction of education and research in industrial engineering

    Kuo, W., Mar 2003, In: Journal of the Chinese Institute of Industrial Engineers. 20, 2, p. 83-90

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

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