Prof. Way KUO (郭位)

Research Output

  1. 2007
  2. IE in the nano era

    Kuo, W., Dec 2007, In: Industrial Engineer. 39, 12

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Comment/debate

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  3. Yield prediction via spatial modeling of clustered defect counts across a wafer map

    Bae, S. J., Hwang, J. Y. & Kuo, W., Dec 2007, In: IIE Transactions (Institute of Industrial Engineers). 39, 12, p. 1073-1083

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 26
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  4. Reliability for sparsely connected consecutive-k systems

    Zhao, X., Cui, L. & Kuo, W., Sep 2007, In: IEEE Transactions on Reliability. 56, 3, p. 516-524

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 41
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  5. Published

    R-Impact: Reliability-based citation impact factor

    Kuo, W. & Rupe, J., Sep 2007, In: IEEE Transactions on Reliability. 56, 3, p. 366-367

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

    Scopus citations: 16
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  6. Statistical models for hot electron degradation in nano-scaled MOSFET devices

    Bae, S. B., Kim, S., Kuo, W. & Kvam, P. H., Sep 2007, In: IEEE Transactions on Reliability. 56, 3, p. 392-400

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 25
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  7. Editorial: How reliable is teaching evaluation? The relationship of class size to teaching evaluation scores

    Kuo, W., Jun 2007, In: IEEE Transactions on Reliability. 56, 2, p. 178-181

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

    Scopus citations: 7
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  8. Identification of control chart patterns using wavelet filtering and robust fuzzy clustering

    Wang, C. & Kuo, W., Jun 2007, In: Journal of Intelligent Manufacturing. 18, 3, p. 343-350

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 49
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  9. Degradation models and implied lifetime distributions

    Bae, S. J., Kuo, W. & Kvam, P. H., May 2007, In: Reliability Engineering and System Safety. 92, 5, p. 601-608

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 156
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  10. Model-based clustering for integrated circuit yield enhancement

    Hwang, J. Y. & Kuo, W., 1 Apr 2007, In: European Journal of Operational Research. 178, 1, p. 143-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 62
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  11. Nonlinear mixed-effects models for repairable systems reliability

    Tan, F., Jiang, Z., Kuo, W. & Bae, S. J., Apr 2007, In: Journal of Shanghai Jiaotong University (Science). 12 E, 2, p. 283-288

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  12. Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569))

    Kuo, W., Mar 2007, In: IEEE Transactions on Reliability. 56, 1, p. 169

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Erratum

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  13. Recent advances in optimal reliability allocation

    Kuo, W. & Wan, R., Mar 2007, In: IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans. 37, 2, p. 143-156

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 311
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  14. An integrated approach for process monitoring using wavelet analysis and competitive neural network

    Wang, C., Kuo, W. & Qi, H., 2007, In: International Journal of Production Research. 45, 1, p. 227-244

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 45
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  15. Bathtub-shaped hazard rate function for ultra-thin gate dielectrics

    Yuan, T. & Kuo, W., 2007, ECS Transactions. Vol. 8. p. 243-248

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  16. Charge Trapping of ultra-thin ZrHfOx/RuOx/ZrHfO x high-k stacks

    Wan, R., Lin, C., Kuo, Y. & Kuo, W., 2007, IEEE International Integrated Reliability Workshop Final Report. p. 99-102 4469230

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  17. Recent advances in optimal reliability allocation

    Kuo, W. & Wan, R., 2007, Computational Intelligence in Reliability Engineering: Evolutionary Techniques in Reliability Analysis and Optimication. Levitin, G. (ed.). Springer-Verlag Berlin Heidelberg, p. 1-36 (Studies in Computational Intelligence; vol. 39).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)12_Chapter in an edited book (Author)peer-review

    Scopus citations: 54
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  18. 2006
  19. Challenges Related to Reliability in Nano Electronics

    KUO, W., Dec 2006, In: IEEE Transactions on Reliability. 55, 4, p. 569-570

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

    Scopus citations: 30
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  20. Detection and classification of defect patterns on semiconductor wafers

    Wang, C., Kuo, W. & Bensmail, H., Dec 2006, In: IIE Transactions (Institute of Industrial Engineers). 38, 12, p. 1059-1068

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 74
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  21. On the dual reliability systems of ( n, f, k ) and 〈 n, f, k 〉

    Cui, L., Kuo, W., Li, J. & Xie, M., 1 Jun 2006, In: Statistics and Probability Letters. 76, 11, p. 1081-1088

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 51
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  22. Reliability redundancy allocation: An improved realization for nonconvex nonlinear programming problems

    Ha, C. & Kuo, W., 16 May 2006, In: European Journal of Operational Research. 171, 1, p. 24-38

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 92
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