Prof. Way KUO (郭位)

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Research Output

  1. 2011
  2. Published

    最优可靠性设计: 基础与应用

    Kuo, W., Prasad, V. R., Tillman, F. A. & Hwang, C., 2011, 第 1 版 ed. 北京: 科学出版社. 337 p. (现代数学译丛; vol. 13)

    Research output: Scholarly Books, Monographs, Reports and Case Studies (RGC: 11, 13, 14, 48, 49) › 14_Edited book (Editor) › peer-review

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  3. 2010
  4. Published

    Foreword

    Kuo, W., Sep 2010, In: International Journal of Performability Engineering. 6, 5

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  5. Published

    Message from honorary chair

    Kuo, W., 2010, In: 2010 IEEE International Conference on Nano/Molecular Medicine and Engineering, IEEE NANOMED 2010. 5749793.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  6. Published

    Stress-induced deterioration of nanocrystalline ITO embedded ZrHfO high-k nonvolatile memories

    Yang, C., Kuo, Y., Lin, C. & Kuo, W., 2010, ECS Transactions. Vol. 33. p. 307-311

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 6
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  7. 2009

  8. A hybrid approach for identification of concurrent control chart patterns

    Wang, C., Dong, T. & Kuo, W., Aug 2009, In: Journal of Intelligent Manufacturing. 20, 4, p. 409-419

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 31
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  9. Published

    Clarifying Some Myths of Teaching and Research

    KUO, W. & E Troy, M., May 2009, 初版 ed. Taiwan: National Tsing Hua University Press. 353 p.

    Research output: Scholarly Books, Monographs, Reports and Case Studies (RGC: 11, 13, 14, 48, 49) › 11_Research book or monograph (Author) › peer-review

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  10. Published

    Recent advances in optimal reliability allocation

    Kuo, W. & Wan, R., 25 Feb 2009, Handbook of Military Industrial Engineering. Badiru, A. B. & Thomas, M. U. (eds.). CRC Press

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 12_Chapter in an edited book (Author) › peer-review

    Scopus citations: 1
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  11. Optimal burn-in for maximizing reliability of repairable non-series systems

    Kim, K. O. & Kuo, W., 16 Feb 2009, In: European Journal of Operational Research. 193, 1, p. 140-151

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 25
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  12. Published

    Accurate conjunction of yield models for fault-tolerant memory integrated circuits

    Ha, C., Kuo, W. & Hwang, J. Y., 2009, In: IEEE Transactions on Semiconductor Manufacturing. 22, 3, p. 344-350 5159401.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  13. Published

    Failure analysis of single and dual nc-ITO embedded ZrHfO high-k nonvolatile memories

    Yang, C., Kuo, Y., Lin, C. & Kuo, W., 2009, ECS Transactions. Vol. 25. p. 457-464

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 8
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  14. Published

    Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009: Preface

    Kuo, W., Kang, R., Liu, G. & Huang, H., 2009, In: Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009. 5270009.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  15. Published

    Reliability of nc-ZnO embedded ZrHfO high-k nonvolatile memory devices stressed at high temperatures

    Yang, C., Kuo, Y., Lin, C. & Kuo, W., 2009, Materials Research Society Symposium Proceedings. Vol. 1160. p. 25-31

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 3
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  16. Published

    Temperature influence on nanocrystals embedded high-k nonvolatile memory characteristics

    Yang, C., Kuo, Y., Lin, C. & Kuo, W., 2009, ECS Transactions. Vol. 19. p. 41-47

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 3
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  17. 2008

  18. Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference

    Yuan, T. & Kuo, W., 1 Oct 2008, In: European Journal of Operational Research. 190, 1, p. 228-240

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 40
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  19. Initial allocation compensation algorithm for redundancy allocation: The scanning heuristic

    Ha, C. & Kuo, W., Jul 2008, In: IIE Transactions (Institute of Industrial Engineers). 40, 7, p. 678-689

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 4
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  20. A model-based clustering approach to the recognition of the spatial defect patterns produced during semiconductor fabrication

    Yuan, T. & Kuo, W., Feb 2008, In: IIE Transactions (Institute of Industrial Engineers). 40, 2, p. 93-101

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 41
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  21. Published

    Comments on "A hierarchy of importance indices"

    Zhu, X. & Kuo, W., 2008, In: IEEE Transactions on Reliability. 57, 3, p. 529-531

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Comment/debate

    Scopus citations: 7
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  22. Failure analysis of nanocrystals embedded high-k dielectrics for nonvolatile memories

    Yang, C., Kuo, Y., Wan, R., Lin, C. & Kuo, W., 2008, IEEE International Reliability Physics Symposium Proceedings. p. 46-49 4558861

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 8
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  23. Relaxation behavior and breakdown mechanisms of nanocrystals embedded Zr-doped HfO2 high-k thin films for nonvolatile memories

    Yang, C., Kuo, Y., Lin, C., Wan, R. & Kuo, W., 2008, Materials Research Society Symposium Proceedings. Vol. 1071. p. 35-42

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 3
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  24. 2007

  25. Compatibility and simplicity: The fundamentals of reliability

    Kuo, W., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 585-586

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

    Scopus citations: 2
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