Prof. Way KUO (郭位)

?
Filters
Filters

Reset

to
1 - 20 out of 127Page size: 20

Research Output

  1. 2009

  2. A hybrid approach for identification of concurrent control chart patterns

    Wang, C., Dong, T. & Kuo, W., Aug 2009, In: Journal of Intelligent Manufacturing. 20, 4, p. 409-419

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 31
    Check@CityULib

  3. Optimal burn-in for maximizing reliability of repairable non-series systems

    Kim, K. O. & Kuo, W., 16 Feb 2009, In: European Journal of Operational Research. 193, 1, p. 140-151

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 25
    Check@CityULib
  4. 2008

  5. Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference

    Yuan, T. & Kuo, W., 1 Oct 2008, In: European Journal of Operational Research. 190, 1, p. 228-240

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 40
    Check@CityULib

  6. Initial allocation compensation algorithm for redundancy allocation: The scanning heuristic

    Ha, C. & Kuo, W., Jul 2008, In: IIE Transactions (Institute of Industrial Engineers). 40, 7, p. 678-689

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 4
    Check@CityULib

  7. A model-based clustering approach to the recognition of the spatial defect patterns produced during semiconductor fabrication

    Yuan, T. & Kuo, W., Feb 2008, In: IIE Transactions (Institute of Industrial Engineers). 40, 2, p. 93-101

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 41
    Check@CityULib

  8. Failure analysis of nanocrystals embedded high-k dielectrics for nonvolatile memories

    Yang, C., Kuo, Y., Wan, R., Lin, C. & Kuo, W., 2008, IEEE International Reliability Physics Symposium Proceedings. p. 46-49 4558861

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 8
    Check@CityULib

  9. Relaxation behavior and breakdown mechanisms of nanocrystals embedded Zr-doped HfO2 high-k thin films for nonvolatile memories

    Yang, C., Kuo, Y., Lin, C., Wan, R. & Kuo, W., 2008, Materials Research Society Symposium Proceedings. Vol. 1071. p. 35-42

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review

    Scopus citations: 3
    Check@CityULib
  10. 2007

  11. Compatibility and simplicity: The fundamentals of reliability

    Kuo, W., Dec 2007, In: IEEE Transactions on Reliability. 56, 4, p. 585-586

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

    Scopus citations: 2
    Check@CityULib

  12. IE in the nano era

    Kuo, W., Dec 2007, In: Industrial Engineer. 39, 12

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Comment/debate

    Check@CityULib

  13. Yield prediction via spatial modeling of clustered defect counts across a wafer map

    Bae, S. J., Hwang, J. Y. & Kuo, W., Dec 2007, In: IIE Transactions (Institute of Industrial Engineers). 39, 12, p. 1073-1083

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 26
    Check@CityULib

  14. Reliability for sparsely connected consecutive-k systems

    Zhao, X., Cui, L. & Kuo, W., Sep 2007, In: IEEE Transactions on Reliability. 56, 3, p. 516-524

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 41
    Check@CityULib

  15. Statistical models for hot electron degradation in nano-scaled MOSFET devices

    Bae, S. B., Kim, S., Kuo, W. & Kvam, P. H., Sep 2007, In: IEEE Transactions on Reliability. 56, 3, p. 392-400

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 25
    Check@CityULib

  16. Editorial: How reliable is teaching evaluation? The relationship of class size to teaching evaluation scores

    Kuo, W., Jun 2007, In: IEEE Transactions on Reliability. 56, 2, p. 178-181

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

    Scopus citations: 7
    Check@CityULib

  17. Identification of control chart patterns using wavelet filtering and robust fuzzy clustering

    Wang, C. & Kuo, W., Jun 2007, In: Journal of Intelligent Manufacturing. 18, 3, p. 343-350

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 49
    Check@CityULib

  18. Degradation models and implied lifetime distributions

    Bae, S. J., Kuo, W. & Kvam, P. H., May 2007, In: Reliability Engineering and System Safety. 92, 5, p. 601-608

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 156
    Check@CityULib

  19. Model-based clustering for integrated circuit yield enhancement

    Hwang, J. Y. & Kuo, W., 1 Apr 2007, In: European Journal of Operational Research. 178, 1, p. 143-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 63
    Check@CityULib

  20. Nonlinear mixed-effects models for repairable systems reliability

    Tan, F., Jiang, Z., Kuo, W. & Bae, S. J., Apr 2007, In: Journal of Shanghai Jiaotong University (Science). 12 E, 2, p. 283-288

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 1
    Check@CityULib

  21. Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569))

    Kuo, W., Mar 2007, In: IEEE Transactions on Reliability. 56, 1, p. 169

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Erratum

    Check@CityULib

  22. Recent advances in optimal reliability allocation

    Kuo, W. & Wan, R., Mar 2007, In: IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans. 37, 2, p. 143-156

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 312
    Check@CityULib

  23. An integrated approach for process monitoring using wavelet analysis and competitive neural network

    Wang, C., Kuo, W. & Qi, H., 2007, In: International Journal of Production Research. 45, 1, p. 227-244

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 45
    Check@CityULib
Previous 1 2 3 4 5 6 7 Next