YE Shuquan (葉舒泉)
Research Output
- 2022
- Online published
Robust Point Cloud Segmentation with Noisy Annotations
Ye, S., Chen, D., Han, S. & Liao, J., 30 Nov 2022, (Online published) In: IEEE Transactions on Pattern Analysis and Machine Intelligence.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Online published
3D Question Answering
Ye, S., Chen, D., Han, S. & Liao, J., 29 Nov 2022, (Online published) In: IEEE Transactions on Visualization and Computer Graphics.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 1 - Published
Meta-PU: An Arbitrary-Scale Upsampling Network for Point Cloud
Ye, S., Chen, D., Han, S., Wan, Z. & Liao, J., 1 Sep 2022, In: IEEE Transactions on Visualization and Computer Graphics. 28, 9, p. 3206-3218Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 17 - 2021
- Published
Learning with Noisy Labels for Robust Point Cloud Segmentation
Ye, S., Chen, D., Han, S. & Liao, J., Oct 2021, Proceedings - 2021 IEEE/CVF International Conference on Computer Vision: ICCV 2021. IEEE, p. 6423-6432 (Proceedings of the IEEE International Conference on Computer Vision).Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review
Scopus citations: 10 - Online published
Exemplar-Based 3D Portrait Stylization
Han, F., Ye, S., He, M., Chai, M. & Liao, J., 24 Sep 2021, (Online published) In: IEEE Transactions on Visualization and Computer Graphics.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
- Published
Coherence and Identity Learning for Arbitrary-length Face Video Generation
Ye, S., Han, C., Lin, J., Han, G. & He, S., Jan 2021, Proceedings of ICPR 2020: 25th International Conference on Pattern Recognition. IEEE, p. 915-922 9412380. (International Conference on Pattern Recognition).Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review