YE Min (叶敏)

Research Output

  1. 2020
  2. Published

    Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory

    Ye, M., Li, Q., Nie, J., Kuo, T. & Xue, C. J., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Natale, G. D., Bolchini, C. & Vatajelu, E. (eds.). IEEE, p. 109-114 6 p. 9116337. (Proceedings of the Design, Automation and Test in Europe Conference and Exhibition).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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