Prof. TU King Ning (杜經寧)
Research Output
- 2025
- Published
Counteracting Effect of Sn Grain Orientation on Current Crowding in Electromigration Failures of Solder Joints
Yao, Y., Lu, Z., An, Y., Tu, K. N. & Liu, Y., Jan 2025, In: Electronic Materials Letters. 21, 1, p. 134-143Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
- 2024
- Published
Quaternary low melting point Sn-Bi-in-xGa solder with improved mechanical performance for advanced electronic packaging
Qiao, J., Mao, X., Xie, L., Xie, S., Tu, K.-N. & Liu, Y., Dec 2024, In: Intermetallics. 175, 108534.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
- Published
Low-temperature attaching of LED chips using SnBiIn solder nanoparticles
Mao, X., An, Y., Yao, Y., Qiao, J., Xie, L., Tu, K.-N. & Liu, Y., Oct 2024, In: Journal of Materials Science: Materials in Electronics. 35, 28, 1881.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
- Published
Influence of Sn grain orientation on mean-time-to-failure equation for microbumps in 3D IC technology
Yao, Y., Gusak, A. M., Chen, C., Liu, Y. & Tu, K. N., 1 Sept 2024, In: Scripta Materialia. 250, 116175.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 2 - Published
Effect of Joule heating on the reliability of microbumps in 3D IC
Yao, Y., An, Y., Dong, J., Wang, Y., Tu, K. N. & Liu, Y., Jul 2024, In: Journal of Materials Research and Technology. 31, p. 3374-3382Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 5 - Published
Mechanical characterizations of η′-Cu6(Sn, In)5 intermetallic compound solder joint: Getting prepared for future nanobumps
Mao, X., An, Y., Chen, Y., Zheng, G., Hou, R., Zhang, X. & Guo, Y. & 3 others, , May 2024, In: Journal of Materials Research and Technology. 30, p. 1136-1147Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 3 - Published
Coupling effect between electromigration and joule heating on the failure of ball grid array in 3D integrated circuit technology
Yao, Y., An, Y., Tu, K. N. & Liu, Y., Jan 2024, In: Journal of Materials Research and Technology. 28, p. 3573-3582Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 4 - Published
Electroplated Low Temperature Self-Annealing Cu Film for Cu-Cu Bonding
Xie, S., Du, F., Xiong, Z., Tu, K.-N. & Liu, Y., 2024, 2024 25th International Conference on Electronic Packaging Technology (ICEPT). Institute of Electrical and Electronics Engineers, Inc., (International Conference on Electronic Packaging Technology, ICEPT ).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Published
Elements of Electromigration: Electromigration in 3D IC Technology
Tu, K.-N. & Liu, Y., 2024, Boca Raton: CRC Press.Research output: Scholarly Books, Monographs, Reports and Case Studies › RGC 11 - Research book or monograph (Author) › peer-review
- Published
Influence Factors of Joule Heating in Microbump in Advanced Packaging Technology
Yao, Y., An, Y., Tu, K. N. & Liu, Y., 2024, 2024 25th International Conference on Electronic Packaging Technology (ICEPT). Institute of Electrical and Electronics Engineers, Inc., (International Conference on Electronic Packaging Technology, ICEPT ).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Published
Microstructure and Intermetallic Growth Characteristics of Sn-Bi-In-xGa Quaternary Low Melting Point Solders
Qiao, J., Mao, X., Tu, K.-N. & Liu, Y., 2024, 2024 International Conference on Electronics Packaging (ICEP). Institute of Electrical and Electronics Engineers, Inc., p. 13-14 (International Conference on Electronics Packaging, ICEP).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Published
Nanocrystalline copper for direct copper-to-copper bonding with improved cross-interface formation at low thermal budget
He, C., Zhou, J., Zhou, R., Chen, C., Jing, S., Mu, K. & Huang, Y.-T. & 5 others, , 2024, In: Nature Communications. 12, 7095.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 3 - Published
Simulation Research on Wafer-Level Electrochemical Deposition Uniformity
Xiong, Z., Xie, S., Tu, K. N. & Liu, Y., 2024, 2024 25th International Conference on Electronic Packaging Technology (ICEPT). Institute of Electrical and Electronics Engineers, Inc., 6 p. (International Conference on Electronic Packaging Technology, ICEPT).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- 2023
- Published
Failure of Ball Grid Array during Electromigration and the Simulation of Dynamic Void Formation
Yao, Y., An, Y., Tu, K.-N. & Liu, Y., Dec 2023, Proceedings of the 25th Electronics Packaging Technology Conference (EPTC 2023). TAY, A., CHUI, K. J., LIM, Y. K., TAN, C. S. & SHIN, S. (eds.). Institute of Electrical and Electronics Engineers, Inc., p. 316-319 (Proceedings of the Electronics Packaging Technology Conference, EPTC).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Published
Low melting point SnBiIn-based micro-nanoparticles for high-density microbump bonding technology
Mao, X., Chen, Y., Tu, K.-N. & Liu, Y., Dec 2023, 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC). Institute of Electrical and Electronics Engineers, Inc., p. 369-372 (Proceedings of the Electronics Packaging Technology Conference, EPTC).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Published
Measurement of Thermal Stress by X-ray Nano-Diffraction in (111)-Oriented Nanotwinned Cu Bumps for Cu/SiO2 Hybrid Joints
Hsu, W.-Y., Yang, S.-C., Lin, Y.-Y., Hsieh, W.-Z., Tu, K.-N., Chiu, W.-L. & Chang, H.-H. & 2 others, , Sept 2023, In: Nanomaterials. 13, 17, 2448.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 6 - Published
Coupling Effect of Electromigration and Joule Heating Induced Failure in Advanced Packaging
Yao, Y., An, Y., Tu, K.-N. & Liu, Y., Aug 2023, 2023 24th International Conference on Electronic Packaging Technology (ICEPT). Institute of Electrical and Electronics Engineers, Inc., (International Conference on Electronic Packaging Technology, ICEPT).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Published
Synergistic Effect of Current Stressing and Temperature Cycling on Reliability of Low Melting Point SnBi Solder
Shen, Z., An, Y., Xiong, Z., Tu, K.-N. & Liu, Y., Aug 2023, 2023 24th International Conference on Electronic Packaging Technology (ICEPT). Institute of Electrical and Electronics Engineers, Inc., 5 p. (International Conference on Electronic Packaging Technology, ICEPT).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
- Accepted/In press/Filed
Solder Alloy Composition, Its Preparation Method And Uses In Room-Temperature Rapid Solid-State Soldering
LIU, Y. (Inventor) & TU, K. N. (Inventor), 12 Jun 2023, (Accepted/In press/Filed) Priority No. 18/333,253Research output: Patents, Agreements and Assignments › RGC 51 - Patents (CityU)
- Published
Electromigration in three-dimensional integrated circuits
Shen, Z., Jing, S., Heng, Y., Yao, Y., Tu, K. N. & Liu, Y., Jun 2023, In: Applied Physics Reviews. 10, 2, 021309.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 18