ZHANG Jieqiong (張洁琼)

Research Output

  1. 2021
  2. Published

    Characteristic Variabilities of Subnanometer EOT La2O3 Gate Dielectric Film of Nano CMOS Devices

    Wong, H., Zhang, J., Iwai, H. & Kakushima, K., Aug 2021, In: Nanomaterials. 11, 8, 2118.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  3. 2017
  4. Published

    High-K Evolution: Subnanometer EOT Challenges and Future Perspectives for Scaling

    Wong, H., Zhang, J., Iwai, H. & Kakushima, K., Oct 2017, Semiconductor Process Integration 10. Murota, J., Claeys, C. L., Iwai, H., Tao, M., Deleonibus, S., Mai, A., Shiojima, K. & Chin, P. (eds.). The Electrochemical Society, p. 81-96 (ECS Transactions; vol. 80, no. 4).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  5. Published

    The scaling issues of subnanometer EOT gate dielectrics for the ultimate nano CMOS technology

    Zhang, J., Wong, H. & Filip, V., Oct 2017, 2017 IEEE 30th International Conference on Microelectronics - Proceedings. IEEE, p. 49-54

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  6. Published

    Effects of thermal annealing on the interface between tungsten and CeO2/La2O3 stack gate dielectrics

    Zhang, J., Wong, H., Kakushima, K. & Iwai, H., 1 Jun 2017, In: Vacuum. 140, p. 7-13

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  7. 2016
  8. Published

    Multilevel characteristics for bipolar resistive random access memory based on hafnium doped SiO2 switching layer

    Wu, J., Ye, C., Zhang, J., Deng, T., He, P. & Wang, H., 1 Mar 2016, In: Materials Science in Semiconductor Processing. 43, p. 144-148

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 12
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  9. Published

    On the Scaling of Lanthanum Oxide Gate Dielectric Film into the Subnanometer EOT Range

    Wong, H., ZHANG, J., Feng, X., Yu, D., Iwai, H. & Kakushima, K., Mar 2016, 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS). IEEE, p. 36-39 (International Conference on Ultimate Integration on Silicon).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 2
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  10. Published

    XPS study on the effects of thermal annealing on CeO2/La2O3 stacked gate dielectrics

    Zhang, J., Wong, H., Kakushima, K. & Iwai, H., 1 Feb 2016, In: Thin Solid Films. 600, p. 30-35

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 20
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  11. Published

    XPS study on the effects of thermal annealing on CeO2/La2O3 stacked gate dielectrics

    Zhang, J., Wong, H., Iwai, H. & Kakushima, K., 5 Jan 2016, IEEE Region 10 Annual International Conference, Proceedings/TENCON. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-January. 7372843

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  12. Published

    Physical Mechanism and Performance Factors of Metal Oxide Based Resistive Switching Memory: A Review

    Ye, C., Wu, J., He, G., Zhang, J., Deng, T., He, P. & Wang, H., Jan 2016, In: Journal of Materials Science and Technology. 32, 1, p. 1-11

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 55
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  13. 2015
  14. Published

    XPS study on the effects of thermal annealing on CeO2/La2O3 stacked gate dielectrics

    Zhang, J., Wong, H., Kakushima, K. & Iwai, H., 1 Nov 2015.

    Research output: Conference Papers (RGC: 31A, 31B, 32, 33)32_Refereed conference paper (no ISBN/ISSN)peer-review

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  15. Published

    Thermal annealing, interface reaction, and lanthanum-based sub-nanometer EOT gate dielectrics

    Wong, H., Zhang, J., Dong, S., Kakushima, K. & Iwai, H., 1 Aug 2015, In: Vacuum. 118, p. 2-7

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 10
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  16. 2014
  17. Published

    X-ray photoelectron spectroscopy study of high-k CeO2/La2O3 stacked dielectrics

    Zhang, J., Wong, H., Yu, D., Kakushima, K. & Iwai, H., 1 Nov 2014, In: AIP Advances. 4, 11, 117117.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 35
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  18. Published

    The interfaces of lanthanum oxide-based subnanometer EOT gate dielectrics

    Wong, H., Zhou, J., Zhang, J., Jin, H., Kakushima, K. & Iwai, H., 2014, In: Nanoscale Research Letters. 9, 1

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 22
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