Prof. WONG Hei (王曦)

Research Output

  1. 1998
  2. Published

    n + /p ultra-shallow junction formation with plasma immersion ion implantation

    Yang, B. L., Jones, E. C., Cheung, N. W., Shao, J., Wong, H. & Cheng, Y. C., 1998, In: Microelectronics Reliability. 38, 9, p. 1489-1494

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 20
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  3. Published

    Simulation of electronic structure of Si-Si bond traps in oxide/nitride/oxide structure

    Gritsenko, V. A., Novikov, Y. N., Morokov, Y. N. & Wong, H., 1998, In: Microelectronics Reliability. 38, 9, p. 1457-1464

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 14
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  4. Published

    Study of MOS gate dielectric breakdown due to drain avalanche breakdown

    Wong, H. & Poon, M. C., 1998, In: Microelectronics Reliability. 38, 9, p. 1433-1438

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  5. Published

    Thermal stability of cobalt and nickel silicides

    Poon, M. C., Ho, C. H., Deng, F., Lau, S. S. & Wong, H., 1998, In: Microelectronics Reliability. 38, 9, p. 1495-1498

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 39
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  6. 1997
  7. Published

    Enriching of the Si3N4 - Thermal oxide interface by excess silicon in ONO structures

    Gritsenko, V. A., Morokov, Y. N., Novikov, Y. N., Petrenko, I. P., Svitasheva, S. N. & Wong, H., Jun 1997, In: Microelectronic Engineering. 36, 1-4, p. 123-124

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  8. Published

    Approximation of the length of velocity saturation region in MOSFET's

    Wong, H. & Poon, M. C., 1997, In: IEEE Transactions on Electron Devices. 44, 11, p. 2033-2036

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 38
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  9. Characterization of light emitting porous polycrystalline silicon films

    Poon, M. C., Han, P. G., Sin, J. K. O., Wong, H. & Ko, P. K., 1997, In: Materials Research Society Symposium - Proceedings. 452, p. 415-420

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

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  10. Characterization of the silicon nitride-thermal oxide interface in ONO structures by ELS, XPS, ellipsometry, and numerical simulation

    Gritsenko, V. A., Morokov, Y. N., Novikov, Y. N., Petrenko, I. P., Svitasheva, S. N., Wong, H., Kwok, R. & 1 others, Chan, R., 1997, Proceedings of the International Conference on Microelectronics. IEEE, Vol. 1. p. 111-114

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 3
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  11. Design automation algorithms for regenerative pass-transistor logic

    Cheung, T. S., Asada, K. & Wong, H., 1997, In: Proceedings - IEEE International Symposium on Circuits and Systems. 3, p. 1540-1543

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

    Scopus citations: 2
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  12. Electronic structure of Si-Si bond in Si3N4 and SiO2: Experiment and simulation by MINDO/3

    Gritsenko, V. A., Milov, A. D., Morokov, Y. N., Novikov, Y. N., Wong, H. & Cheng, Y. C., 1997, In: Materials Research Society Symposium - Proceedings. 446, p. 169-173

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

    Scopus citations: 2
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  13. Published

    Grain-boundary resistivity in barium titanate ceramic positive temperature coefficient sensors

    Wong, H., Han, P. G., Poon, M. C., Chen, Y. Y. & Zheng, X. R., 1997, Proceedings of the IEEE Hong Kong Electron Devices Meeting. IEEE, p. 153-156

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
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  14. Published

    Modeling of chaotic characteristics in integrated phase-locked loop

    Siu, W. K., Wong, H., Cheung, T. S. & Man, K. F., 1997, Proceedings of the International Conference on Microelectronics. IEEE, Vol. 2. p. 751-754

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Check@CityULib
  15. Published

    Modeling of gate dielectric breakdown due to drain avalanche injection in MOSFET's

    Wong, H. & Poon, M. C., 1997, Proceedings of the International Conference on Microelectronics. IEEE, Vol. 2. p. 655-658

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  16. Published

    Nonlinearities and chaos in NMOS phase-locked loop

    Siu, W. K., Wong, H. & Cheung, T. S., 1997, International Symposium on IC Technology, Systems and Applications. Vol. 7. p. 262-265

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  17. n+/p ultra-shallow junction formation with Plasma Immersion Ion Implantation

    Yang, B. L., Jones, E. C., Cheung, N. W., Shao, J., Wong, H. & Cheng, Y. C., 1997, Proceedings of the IEEE Hong Kong Electron Devices Meeting. IEEE, p. 7-10

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  18. Porous silicon organic vapor and humidity sensor

    Poon, M. C., Sin, J. K. O., Wong, H., Han, P. G., Kwok, W. H. & Bow, Y. C., 1997, In: Materials Research Society Symposium - Proceedings. 459, p. 183-188

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

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  19. Published

    Simulation of hot-carrier reliability in MOS integrated circuits

    Wong, H. & Poon, M. C., 1997, Proceedings of the International Conference on Microelectronics. IEEE, Vol. 2. p. 625-628

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 3
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  20. Published

    Surface electronic structure of light-emitting porous polycrystalline silicon thin films

    Han, P. G., Wong, H. & Poon, M. C., 1997, Proceedings of the IEEE Hong Kong Electron Devices Meeting. IEEE, p. 136-139

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Check@CityULib
  21. Thermal stability of cobalt and nickel silicides in amorphous and crystalline silicon

    Poon, M. C., Deng, F., Wong, H., Wong, M., Sin, J. K. O., Lau, S. S., Ho, C. H. & 1 others, Han, P. G., 1997, Proceedings of the IEEE Hong Kong Electron Devices Meeting. IEEE, p. 65-68

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 3
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  22. Thermal stability of nickel silicide films in submicron p-type polysilicon lines

    Poon, M. C., Deng, F., Wong, H., Chan, M., Sin, J. K. O., Lau, S. S., Ho, C. H. & 1 others, Han, P. G., 1997, Proceedings of the IEEE Hong Kong Electron Devices Meeting. IEEE, p. 54-58

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
    Check@CityULib