Prof. WONG Hei (王曦)

Research Output

  1. 2017
  2. Published

    Analytical modeling on the drain current characteristics of gate-all-around TFET with the incorporation of short-channel effects

    Xu, W., Wong, H., Iwai, H., Liu, J. & Qin, P., Dec 2017, In: Solid-State Electronics. 138, p. 24-29

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  3. Published

    Geometry and temperature effects on the threshold voltage characteristics of silicon nanowire MOS transistors

    Wong, H., Yu, Q., Dong, S., Kakushima, K. & Iwai, H., Dec 2017, In: Solid-State Electronics. 138, p. 35-39

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  4. Published

    Review on peculiar issues of field emission in vacuum nanoelectronic devices

    Filip, V., Filip, L. D. & Wong, H., Dec 2017, In: Solid-State Electronics. 138, p. 3-15

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 11
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  5. Published

    High-κ Dielectric Scaling for Nano-CMOS Technology

    Wong, H., Kawanago, T., Kakushima, K. & Iwai, H., 22 Nov 2017, Integrated Nanodevice and Nanosystem Fabrication: Breakthroughs and Alternatives. Deleonibus, S. (ed.). Pan Stanford Publishing Pte. Ltd., Vol. 2. p. 125-179 (Pan Stanford Series on Intelligent Nanosystems ; vol. 2).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)12_Chapter in an edited book (Author)peer-review

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  6. Published

    28 nm CMOS process ESD protection based on diode-triggered silicon controlled rectifier

    Li, X., Dong, S., Jin, H., Miao, M., Hu, T., Guo, W. & Wong, H., Nov 2017, In: Solid-State Electronics. 137, p. 128-133

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  7. Published

    A Low Power CMOS Magnetic Field Sensor consisting of a MAGFET and a Pulse Width Modulated Readout Circuit

    Lai, S., Ng, W., Tam, W., Kok, C. & Wong, H., Oct 2017, IEEE EDSSC 2017 - The 13th IEEE International Conference on Electron Devices and Solid-State Circuits. Institute of Electrical and Electronics Engineers Inc., p. 1-2

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 2
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  8. Published

    A study on split-drain MAGFET channel boundary charge trapping based on numerical simulation

    Lai, S., Tam, W., Kok, C. & Wong, H., Oct 2017, IEEE EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits. IEEE

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  9. Published

    High-K Evolution: Subnanometer EOT Challenges and Future Perspectives for Scaling

    Wong, H., Zhang, J., Iwai, H. & Kakushima, K., Oct 2017, Semiconductor Process Integration 10. Murota, J., Claeys, C. L., Iwai, H., Tao, M., Deleonibus, S., Mai, A., Shiojima, K. & Chin, P. (eds.). The Electrochemical Society, p. 81-96 (ECS Transactions; vol. 80, no. 4).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  10. Published

    The scaling issues of subnanometer EOT gate dielectrics for the ultimate nano CMOS technology

    Zhang, J., Wong, H. & Filip, V., Oct 2017, 2017 IEEE 30th International Conference on Microelectronics - Proceedings. IEEE, p. 49-54

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  11. Published

    Effects of thermal annealing on the interface between tungsten and CeO2/La2O3 stack gate dielectrics

    Zhang, J., Wong, H., Kakushima, K. & Iwai, H., 1 Jun 2017, In: Vacuum. 140, p. 7-13

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  12. Published

    A Bias-Bounded Digital True Random Number Generator Architecture

    Liu, Y., Cheung, R. C. C. & Wong, H., 1 Jan 2017, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 64, 1, p. 133-144 7593310.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 28
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  13. 2016
  14. Published

    Layout optimization of GGISCR structure for on-chip system level ESD protection applications

    Zeng, J., Dong, S., Wong, H., Hu, T. & Li, X., 1 Dec 2016, In: Solid-State Electronics. 126, p. 152-157

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  15. Study of composite cathodes in electron field emission devices: Relative contributions of resonant and sequential tunneling

    Filip, V., Wong, H., Tam, W. & Kok, C., 12 Aug 2016, 2016 5th International Symposium on Next-Generation Electronics, ISNE 2016. Institute of Electrical and Electronics Engineers Inc., 7543403

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
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  16. Comparative study of resonant and sequential features in electron field emission from composite surfaces

    Filip, V. & Wong, H., 1 Jun 2016, In: Thin Solid Films. 608, p. 26-33

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  17. Published

    Editorial

    Asenov, A., Schichtmann, U., Tan, C. M., Wong, H. & Zhou, X., 1 Jun 2016, In: Microelectronics Reliability. 61, p. 1-2

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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  18. Effects of thermal annealing on the charge localization characteristics of HfO2/Au/HfO2 stack

    Feng, X., Dong, S., Wong, H., Yu, D., Pey, K. L., Shubhakar, K. & Lau, W. S., Jun 2016, In: Microelectronics Reliability. 61, p. 78-81

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  19. Published

    Simulation and evaluation of the peak temperature in LED light bulb heatsink

    Sun, L., Zhu, J. & Wong, H., Jun 2016, In: Microelectronics Reliability. 61, p. 140-144

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 9
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  20. The variation of the leakage current characteristics of W/Ta2O5/W MIM capacitors with the thickness of the bottom W electrode

    Yu, D. Q., Lau, W. S., Wong, H., Feng, X., Dong, S. & Pey, K. L., Jun 2016, In: Microelectronics Reliability. 61, p. 95-98

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 6
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  21. Published

    Confirmation of the surface smoothing effect of atomic layer deposition and the physical mechanism responsible for such an effect

    Lau, W. S., Yu, D. Q., Wang, X., Wong, H. & Xu, Y., 2 May 2016, China Semiconductor Technology International Conference 2016, CSTIC 2016. Institute of Electrical and Electronics Engineers Inc., 7464021

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
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  22. Published

    On the Scaling of Lanthanum Oxide Gate Dielectric Film into the Subnanometer EOT Range

    Wong, H., ZHANG, J., Feng, X., Yu, D., Iwai, H. & Kakushima, K., Mar 2016, 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS). IEEE, p. 36-39 (International Conference on Ultimate Integration on Silicon).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 2
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