Prof. WONG Hei (王曦)

Research Output

  1. 2021
  2. Online published

    Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices

    WONG, H., DONG, S. & CHEN, Z., Feb 2022, In: Science China Information Sciences. 65, 2, 129403.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Letterpeer-review

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  3. 2020
  4. Published

    CMOS low power split-drain MAGFET based magnetic field strength sensor

    Lai, S., Tam, W., Kok, C. & Wong, H., Jun 2020, In: Microelectronics Journal. 100, 104759.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  5. Published

    Temperature dependent characteristics of graphene/silicon Schottky junction

    Anwar, M. A., Dong, S. & Wong, H., 2020, In: International Journal of Nanotechnology. 17, 1, p. 4-15

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  6. 2019
  7. Published

    Special Issue on Reliability

    MAHAPATRA, S., KERBER, A., COMPAGNONI, C. M., KOVAL, R., MENEGHESSO, G., SHERIDAN, D., RAMEY, S. & 8 others, WANG, R., STATHIS, J., CHEN, K. J., KACZER, B., PANCHERI, L., ROSENBAUM, E., MOULI, C. & WONG, H., Nov 2019, In: IEEE Transactions on Electron Devices. 66, 11, p. 4497-4503

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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  8. Published

    Flexible wireless skin impedance sensing system for wound healing assessment

    Pei, X., Jin, H., Dong, S., Lou, D., Ma, L., Wang, X., Cheng, W. & 1 others, Wong, H., Oct 2019, In: Vacuum. 168, 108808.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  9. Published

    On the Issues of Subnanometer EOT Gate Dielectric Scaling

    Wong, H., Liou, J. J. & Wei, R. H., Oct 2019, 2019 8th International Symposium on Next Generation Electronics (ISNE). IEEE, 8896356. (International Symposium on Next Generation Electronics, ISNE).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  10. Published

    Compact modeling of sectorial split-drain magnetic field-effect transistors

    Lai, S. & Wong, H., Sep 2019, In: Vacuum. 167, p. 68-72

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  11. Published

    On the ESD Protection and Non-Fatal ESD Strike on Nano CMOS Devices

    Wong, H., Dong, S. & Chen, Z., Sep 2019, 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 3-8 8889652. (Proceedings (International Conference on Microelectronics)).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  12. Published

    Difficulty involved to observe the surface smoothing effect of an amorphous High-k dielectric thin film deposited by atomic layer deposition on a metastable metal film

    Lau, W. S., Du, L., Wong, H. & Dong, S., Mar 2019, China Semiconductor Technology International Conference 2019 (CSTIC 2019). Claeys, C., Huang, R., Wu, H., Lin, Q., Liang, S., Song, P., Guo, Z., Lai, K., Zhang, Y., Qu, X., Lung, H. & Yu, W. (eds.). IEEE, 8755645. (China Semiconductor Technology International Conference, CSTIC).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 2
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  13. 2018
  14. Published

    Compact Modeling and Short-Channel Effects of Nanowire MOS Transistors (Invited)

    Wong, H., Nov 2018, p. 7-10.

    Research output: Conference Papers (RGC: 31A, 31B, 32, 33)31A_Invited conference paper (refereed items)Yespeer-review

    Scopus citations: 1
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  15. Published

    Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress

    Feng, X., Raghavan, N., Mei, S., Dong, S., Pey, K. L. & Wong, H., Sep 2018, In: Microelectronics Reliability. 88-90, p. 164-168

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  16. Published

    Quantum focusing and filtering of electrons propagating coherently through non-uniform potential barriers

    Filip, V., Enăchescu, M. & Wong, H., 30 Aug 2018, In: Thin Solid Films. 660, p. 546-557

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  17. Published

    Lightweight secure processor prototype on FPGA

    Liu, Y., Cheung, R. C. C. & Wong, H., Aug 2018, Proceedings - 2018 International Conference on Field-Programmable Logic and Applications, FPL 2018. IEEE, p. 443-444 8530789. (Proceedings - 2018 International Conference on Field-Programmable Logic and Applications, FPL 2018).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
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  18. Published

    AFM study on the surface morphologies of TiN films prepared by magnetron sputtering and Al2O3 films prepared by atomic layer deposition

    Du, L., Wong, H., Dong, S., Lau, W. & Filip, V., Jul 2018, In: Vacuum. 153, p. 139-144

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 5
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  19. Published

    High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser Inputs

    Liu, Y., Li, X., Cheung, R. C. C., Chan, S. & Wong, H., Jun 2018, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 65, 6, p. 794-798

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 4
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  20. Published

    A double snapback SCR ESD protection scheme for 28 nm CMOS process

    Hu, T., Dong, S., Jin, H., Wong, H., Xu, Z., Li, X. & Liou, J. J., May 2018, In: Microelectronics Reliability. 84, p. 20-25

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 8
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  21. Published

    On the RF energy harvesting based on CMOS technology

    Wong, H., Wang, W. & Chen, Z., May 2018, Proceedings - 2018 7th International Symposium on Next-Generation Electronics (ISNE). IEEE

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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  22. Published

    A SYSTEM-ON-CHIP 1.5 GHz PHASE LOCKED LOOP REALIZED USING 40 nm CMOS TECHNOLOGY

    Wang, W., Chen, X. & Wong, H., Mar 2018, In: Facta universitatis - series: Electronics and Energetics. 31, 1, p. 101-113

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  23. 2017
  24. Published

    Analytical modeling on the drain current characteristics of gate-all-around TFET with the incorporation of short-channel effects

    Xu, W., Wong, H., Iwai, H., Liu, J. & Qin, P., Dec 2017, In: Solid-State Electronics. 138, p. 24-29

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  25. Published

    Geometry and temperature effects on the threshold voltage characteristics of silicon nanowire MOS transistors

    Wong, H., Yu, Q., Dong, S., Kakushima, K. & Iwai, H., Dec 2017, In: Solid-State Electronics. 138, p. 35-39

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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