Research output per year
Research output per year
Research output
Search results
-
2012
A comparative study of charge pumping circuits for flash memory applications
Wong, O. Y., Wong, H., Tam, W. S. & Kok, C. W., Apr 2012, In: Microelectronics Reliability. 52, 4, p. 670-687Research output: Journal Publications and Reviews › RGC 62 - Review of books or of software (or similar publications/items) › peer-review
28 Citations (Scopus) -
2006
On the scaling issues and high-κ replacement of ultrathin gate dielectrics for nanoscale MOS transistors
Wong, H. & Iwai, H., Oct 2006, In: Microelectronic Engineering. 83, 10, p. 1867-1904Research output: Journal Publications and Reviews › RGC 62 - Review of books or of software (or similar publications/items) › peer-review
377 Citations (Scopus) -
2005
High-k Gate Dielectrics
Misra, D., Iwai, H. & Wong, H., Jun 2005, In: Electrochemical Society Interface. 14, 2, p. 30-34Research output: Journal Publications and Reviews › RGC 62 - Review of books or of software (or similar publications/items) › peer-review
38 Citations (Scopus) -
2004
Conduction mechanisms in MOS gate dielectric films
Yang, B. L., Lai, P. T. & Wong, H., May 2004, In: Microelectronics Reliability. 44, 5, p. 709-718Research output: Journal Publications and Reviews › RGC 62 - Review of books or of software (or similar publications/items) › peer-review
103 Citations (Scopus) -
2003
Low-frequency noise study in electron devices: Review and update
Wong, H., Apr 2003, In: Microelectronics Reliability. 43, 4, p. 585-599Research output: Journal Publications and Reviews › RGC 62 - Review of books or of software (or similar publications/items) › peer-review
102 Citations (Scopus) -
2002
Recent developments in silicon optoelectronic devices
Wong, H., Mar 2002, In: Microelectronics Reliability. 42, 3, p. 317-326Research output: Journal Publications and Reviews › RGC 62 - Review of books or of software (or similar publications/items) › peer-review
55 Citations (Scopus)