Prof. LAU Chun Pong (劉俊邦)
Research Output
- 2025
- Published
Some Challenges and Solutions in Data-Driven AI
Chellappa, R., Liu, J., Lau, C. P. & Dhar, P., 2025, Computer Vision: Challenges, Trends, and Opportunities. Ahad, M. A. R., Mahbub, U., Turk, M. & Hartley, R. (eds.). New York: Chapman and Hall/CRC, p. 1-17 (Chapman & Hall/CRC Computer Vision).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 12 - Chapter in an edited book (Author) › peer-review
- 2024
- Online published
Whole-Body Detection, Identification and Recognition at Altitude and Range
Huang, S., Kathirvel, R. P., Guo, Y., Lau, C. P. & Chellappa, R., 28 Oct 2024, (Online published) In: IEEE Transactions on Biometrics, Behavior, and Identity Science.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
- Published
Diffuse and Restore: A Region-Adaptive Diffusion Model for Identity-Preserving Blind Face Restoration
Suin, M., Nair, N. G., Lau, C. P., Patel, V. M. & Chellappa, R., 2024, Proceedings - 2024 IEEE Winter Conference on Applications of Computer Vision WACV 2024. Institute of Electrical and Electronics Engineers, Inc., p. 6331-6340 10 p. (IEEE Winter Conference on Applications of Computer Vision).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Scopus citations: 3 - 2023
- Published
Interpolated Joint Space Adversarial Training for Robust and Generalizable Defenses
Lau, C. P., Liu, J., Souri, H., Lin, W.-A., Feizi, S. & Chellappa, R., 1 Nov 2023, In: IEEE Transactions on Pattern Analysis and Machine Intelligence. 45, 11, p. 13054-13067Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 7 - Published
ATDetect: Face Detection and Keypoint Extraction at Range and Altitude
Lau, C. P., Suin, M. & Chellappa, R., Sept 2023, 2023 IEEE International Joint Conference on Biometrics (IJCB). Institute of Electrical and Electronics Engineers, Inc., 10 p. (IEEE International Joint Conference on Biometrics, IJCB).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Scopus citations: 1