Division of Applied Science and Technology, Community College of City University

Organisational unit: Academic Departments

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  1. Published
    TIAN, J., HU, N., KWONG, T. & TANG, Y. Y., Jul 2019, Proceedings of 2019 International Conference on Wavelet Analysis and Pattern Recognition. Institute of Electrical and Electronics Engineers, 8946462. (International Conference on Wavelet Analysis and Pattern Recognition; vol. 2019-July).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
  2. Published
    Lau, C. H., Yeung, A. K. & Yan, F., Dec 2018, 2018 IEEE Conference on Dependable and Secure Computing (DSC). IEEE, 8625141. (DSC 2018 - 2018 IEEE Conference on Dependable and Secure Computing).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 8
  3. Published
    Wang, M., Hou, L., Wong, E. W. M., Guo, J., Liu, J., LI, F., Cai, A. & 5 others, Mehrvar, H., Wang, D., Geng, D., Bernier, E. & Zukerman, M., Jul 2015, p. 1-4.

    Research output: Conference Papers (RGC: 31A, 31B, 32, 33)31A_Invited conference paper (refereed items)Yespeer-review

  4. Published
    YAN, F., CHEN, G. & YEUNG, K. H. A., 8 Sep 2013.

    Research output: Conference Papers (RGC: 31A, 31B, 32, 33)32_Refereed conference paper (no ISBN/ISSN)peer-review

  5. Published
    TSE, W. T., lam, C. & HU, J. F., 10 Nov 2012.

    Research output: Conference Papers (RGC: 31A, 31B, 32, 33)31A_Invited conference paper (refereed items)Yespeer-review

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Most Cited

  1. Lau, C. H., Yeung, A. K. & Yan, F., Dec 2018, 2018 IEEE Conference on Dependable and Secure Computing (DSC). IEEE, 8625141. (DSC 2018 - 2018 IEEE Conference on Dependable and Secure Computing).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 8
  2. Ku, K. K., BRADBEER, R. & Lam, K., 2008, Mechatronics and machine vision in practice. Billingsley, J. & Bradbeer, R. (eds.). Berlin: Springer Verlag, p. 167-179

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)12_Chapter in an edited book (Author)peer-review

    Scopus citations: 2
  3. Ku, K. K. & BRADBEER, R., 2008, Mechatronics and machine vision in practice. Billingsley, J. & Bradbeer, R. (eds.). Berlin: Springer Verlag, p. 209-218

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)12_Chapter in an edited book (Author)peer-review

    Scopus citations: 1
  4. TIAN, J., HU, N., KWONG, T. & TANG, Y. Y., Jul 2019, Proceedings of 2019 International Conference on Wavelet Analysis and Pattern Recognition. Institute of Electrical and Electronics Engineers, 8946462. (International Conference on Wavelet Analysis and Pattern Recognition; vol. 2019-July).

    Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

    Scopus citations: 1
  5. BRADBEER, R. (ed.) & Ku, K. K. (ed.), 2007, Piscataway, N.J.: IEEE.

    Research output: Scholarly Books, Monographs, Reports and Case Studies (RGC: 11, 13, 14, 48, 49)14_Edited book (Editor)peer-review

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