Ultramicroscopy

Ultramicroscopy

ISSNs: 0304-3991

Additional searchable ISSN (electronic): 1879-2723

Elsevier BV, Netherlands

Scopus rating (2023): CiteScore 4.6 SJR 0.78 SNIP 0.802

Journal

Journal Metrics

Research Output

  1. 2019
  2. Nanoscale measurement of giant saturation magnetization in α″-Fe16N2 by electron energy-loss magnetic chiral dichroism

    Chen, X., Higashikozono, S., Ito, K., Jin, L., Ho, P., Yu, C., Tai, N., & 4 othersMayer, J., Dunin-Borkowski, R. E., Suemasu, T. & Zhong, X., Aug 2019, In: Ultramicroscopy. 203, p. 37-43

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 9
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  3. 2018
  4. Effect of cation ratio and order on magnetic circular dichroism in the double perovskite Sr2Fe1+xRe1-xO6

    Ho, P., Yu, C., Zhang, Q., Song, K., Buban, J. P., Choi, S., Dunin-Borkowski, R. E., & 5 othersMayer, J., Tai, N., Zhu, J., Jin, L. & Zhong, X., Oct 2018, In: Ultramicroscopy. 193, p. 137-142

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 10
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  5. Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopy

    Lopatin, S., Cheng, B., Liu, W., Tsai, M., He, J. & Chuvilin, A., Jan 2018, In: Ultramicroscopy. 184, Part A, p. 109-115

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 29
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  6. 2017
  7. Comment on, “On the influence of the electron dose-rate on the HRTEM image contrast”, by Juri Barthel, Markus Lentzen, Andreas Thust, ULTRAM12246 (2016), http://dx.doi.org/10.1016/j.ultramic.2016.11.016

    Kisielowski, C., Calderon, H. A., Chen, F. R., Helveg, S., Jinschek, J. R., Specht, P. & Van Dyck, D., Aug 2017, In: Ultramicroscopy. 179, p. 108-112

    Research output: Journal Publications and ReviewsComment/debate

    Scopus citations: 1
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  8. Development of compact Cs corrector for desktop electron microscope

    Chang, W. & Chen, F., Aug 2017, In: Ultramicroscopy. 179, p. 94-99

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 2
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  9. 2016
  10. Wide-range tunable magnetic lens for tabletop electron microscope

    Chang, W. & Chen, F., Dec 2016, In: Ultramicroscopy. 171, p. 139-145

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 4
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  11. 2015
  12. Precisely detecting atomic position of atomic intensity images

    Wang, Z., Guo, Y., Tang, S., Li, J., Wang, J. & Zhou, Y., 1 Mar 2015, In: Ultramicroscopy. 150, p. 74-78

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 3
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  13. 2012
  14. Direct structure inversion from exit waves. Part II: A practical example

    Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D., May 2012, In: Ultramicroscopy. 116, p. 77-85

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 14
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  15. 2011
  16. A method to determine the local surface profile from reconstructed exit waves

    Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D., Jul 2011, In: Ultramicroscopy. 111, 8, p. 1352-1359

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 4
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  17. Effect of ambient humidity on the strength of the adhesion force of single yeast cell inside environmental-SEM

    Shen, Y., Nakajima, M., Ridzuan Ahmad, M., Kojima, S., Homma, M. & Fukuda, T., Jul 2011, In: Ultramicroscopy. 111, 8, p. 1176-1183

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 26
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  18. 2010
  19. A new method for the reconstruction of micro- and nanoscale planar periodic structures

    Hu, Z., Xie, H., Lu, J., Liu, Z. & Wang, Q., Aug 2010, In: Ultramicroscopy. 110, 9, p. 1223-1230

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 20
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  20. Direct structure inversion from exit waves. Part I: Theory and simulations

    Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D., Apr 2010, In: Ultramicroscopy. 110, 5, p. 527-534

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 34
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  21. Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

    Alloyeau, D., Hsieh, W. K., Anderson, E. H., Hilken, L., Benner, G., Meng, X., Chen, F. R., & 1 othersKisielowski, C., Apr 2010, In: Ultramicroscopy. 110, 5, p. 563-570

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 34
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  22. 2007
  23. Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy

    Hirata, A., Hirotsu, Y., Nieh, T. G., Ohkubo, T. & Tanaka, N., Feb 2007, In: Ultramicroscopy. 107, 2-3, p. 116-123

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 26
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  24. 2006
  25. Spatial incoherence in phase retrieval based on focus variation

    Martin, A. V., Chen, F. R., Hsieh, W. K., Kai, J. J., Findlay, S. D. & Allen, L. J., Aug 2006, In: Ultramicroscopy. 106, 10, p. 914-924

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 56
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  26. 2005
  27. Photoelectric effect and transport properties of a single CdS nanoribbon

    Chen, J., Xue, K., An, J., Tsang, S. W., Ke, N., Xu, J. B., Li, Q., & 1 othersWang, C. R., Nov 2005, In: Ultramicroscopy. 105, 1-4, p. 275-280

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 20
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  28. Dip Pen Nanolithography (DPN): process and instrument performance with NanoInk's NSCRIPTOR system

    Haaheim, J., Eby, R., Nelson, M., Fragala, J., Rosner, B., Zhang, H. & Athas, G., May 2005, In: Ultramicroscopy. 103, 2, p. 117-132

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 88
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  29. 2004
  30. Resolution extension and exit wave reconstruction in complex HREM

    Hsieh, W., Chen, F., Kai, J. & Kirkland, A. I., Jan 2004, In: Ultramicroscopy. 98, 2-4, p. 99-114

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 68
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  31. 1995
  32. Applications of apertured photon scanning tunnelling microscopy (APSTM)

    Tsai, D. P., Kovacs, J. & Moskovits, M., Feb 1995, In: Ultramicroscopy. 57, 2-3, p. 130-140

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 12
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  33. 1994
  34. High-resolution electron microscopy of Cu/MgO and Pd/MgO interfaces

    Chen, F. R., Chiou, S. K., Chang, L. & Hong, C. S., Jun 1994, In: Ultramicroscopy. 54, 2-4, p. 179-191

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 54
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