Ultramicroscopy

Ultramicroscopy

ISSNs: 0304-3991

Additional searchable ISSN (Electronic): 1879-2723

Elsevier BV, Netherlands

Scopus rating (2018): CiteScore 2.72 SJR 1.556 SNIP 1.217

Journal

Journal Metrics

Research Output

  1. 2019
  2. Published

    Automatic 3D reconstruction of SEM images based on Nano-robotic manipulation and epipolar plane images

    Ding, W., Zhang, Y., Lu, H., Wan, W. & Shen, Y., May 2019, In : Ultramicroscopy. 200, p. 149-159

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

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  3. Published

    360° multiparametric imaging atomic force microscopy: A method for three-dimensional nanomechanical mapping

    Lu, H., Wen, Y., Zhang, H., Xie, H. & Shen, Y., Jan 2019, In : Ultramicroscopy. 196, p. 83-87

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

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  4. 2018
  5. Published

    Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons

    Wan Weishi, Chen Fu-Rong & Zhu Yimei, Nov 2018, In : Ultramicroscopy. 194, p. 143-153

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 4
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  6. Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopy

    Lopatin, S., Cheng, B., Liu, W., Tsai, M., He, J. & Chuvilin, A., Jan 2018, In : Ultramicroscopy. 184, Part A, p. 109-115

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 7
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  7. 2017
  8. Comment on, “On the influence of the electron dose-rate on the HRTEM image contrast”, by Juri Barthel, Markus Lentzen, Andreas Thust, ULTRAM12246 (2016), http://dx.doi.org/10.1016/j.ultramic.2016.11.016

    Kisielowski, C., Calderon, H., Chen, F. R., Helveg, S., Jinschek, J., Specht, P. & Van Dyck, D., Aug 2017, In : Ultramicroscopy. 179, p. 108-112

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Comment/debateNot applicable

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  9. Development of compact Cs corrector for desktop electron microscope

    Chang, W. & Chen, F., Aug 2017, In : Ultramicroscopy. 179, p. 94-99

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 1
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  10. 2016
  11. Wide-range tunable magnetic lens for tabletop electron microscope

    Chang, W. & Chen, F., Dec 2016, In : Ultramicroscopy. 171, p. 139-145

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 2
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  12. 2012
  13. Direct structure inversion from exit waves. Part II: A practical example

    Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D., May 2012, In : Ultramicroscopy. 116, p. 77-85

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 7
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  14. 2011
  15. A method to determine the local surface profile from reconstructed exit waves

    Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D., Jul 2011, In : Ultramicroscopy. 111, 8, p. 1352-1359

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 4
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  16. Effect of ambient humidity on the strength of the adhesion force of single yeast cell inside environmental-SEM

    Shen, Y., Nakajima, M., Ridzuan Ahmad, M., Kojima, S., Homma, M. & Fukuda, T., Jul 2011, In : Ultramicroscopy. 111, 8, p. 1176-1183

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 19
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  17. 2010
  18. A new method for the reconstruction of micro- and nanoscale planar periodic structures

    Hu, Z., Xie, H., Lu, J., Liu, Z. & Wang, Q., Aug 2010, In : Ultramicroscopy. 110, 9, p. 1223-1230

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 16
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  19. Direct structure inversion from exit waves. Part I: Theory and simulations

    Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D., Apr 2010, In : Ultramicroscopy. 110, 5, p. 527-534

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 25
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  20. Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

    Alloyeau, D., Hsieh, W. K., Anderson, E. H., Hilken, L., Benner, G., Meng, X., Chen, F. R. & 1 othersKisielowski, C., Apr 2010, In : Ultramicroscopy. 110, 5, p. 563-570

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 26
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  21. 2007
  22. Published

    An alternative approach to carbon nanotube sample preparation for TEM investigation

    Caplovicova, M., Danis, T., Buc, D., Caplovic, L., Janik, J. & Bello, I., Aug 2007, In : Ultramicroscopy. 107, 8, p. 692-697

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 11
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  23. 2006
  24. Spatial incoherence in phase retrieval based on focus variation

    Martin, A. V., Chen, F. R., Hsieh, W. K., Kai, J. J., Findlay, S. D. & Allen, L. J., Aug 2006, In : Ultramicroscopy. 106, 10, p. 914-924

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 48
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  25. 2005
  26. Photoelectric effect and transport properties of a single CdS nanoribbon

    Chen, J., Xue, K., An, J., Tsang, S. W., Ke, N., Xu, J. B., Li, Q. & 1 othersWang, C. R., Nov 2005, In : Ultramicroscopy. 105, 1-4, p. 275-280

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 17
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  27. 2004
  28. Resolution extension and exit wave reconstruction in complex HREM

    Hsieh, W., Chen, F., Kai, J. & Kirkland, A. I., Jan 2004, In : Ultramicroscopy. 98, 2-4, p. 99-114

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 51
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  29. 1994
  30. High-resolution electron microscopy of Cu/MgO and Pd/MgO interfaces

    Chen, F. R., Chiou, S. K., Chang, L. & Hong, C. S., Jun 1994, In : Ultramicroscopy. 54, 2-4, p. 179-191

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 53
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  31. 1993
  32. HRTEM study of atomic faceting of asymmetrical twin and asymmetrical hetero-twin boundaries in NiSi2/Si

    Chen, W. & Chen, F., Jun 1993, In : Ultramicroscopy. 51, 1-4, p. 316-327

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

    Scopus citations: 4
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