Thin Solid Films

Thin Solid Films

ISSNs: 0040-6090

Additional searchable ISSN (Electronic): 1879-2731

Elsevier BV, Netherlands

Scopus rating (2021): CiteScore 4.3 SJR 0.468 SNIP 0.772

Journal

Journal Metrics

Research Output

  1. 1981
  2. Germanide formation by thermal treatment of platinum films deposited on single-crystal Ge〈100〉 substrates

    Grimaldi, M. G., Wieluński, L., Nicolet, M. A. & Tu, K. N., 24 Jul 1981, In: Thin Solid Films. 81, 3, p. 207-211

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 30
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  3. 1978
  4. Contact reactions between amorphous silicon and single-crystal metallic films

    Köster, U., Campbell, D. R. & Tu, K. N., 1 Sep 1978, In: Thin Solid Films. 53, 2, p. 129-134

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 15
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  5. 1975
  6. Implanted noble gas atoms as diffusion markers in silicide formation

    Chu, W. K., Lau, S. S., Mayer, J. W., Müller, H. & Tu, K. N., Feb 1975, In: Thin Solid Films. 25, 2, p. 393-402

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 234
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  7. Structure and growth kinetics of Ni2Si on silicon

    Tu, K. N., Chu, W. K. & Mayer, J. W., Feb 1975, In: Thin Solid Films. 25, 2, p. 403-413

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 190
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  8. Diffusion of arsenic along dislocations in epitaxial silicon films

    Campbell, D. R., Tu, K. N. & Schwenker, R. O., Jan 1975, In: Thin Solid Films. 25, 1, p. 213-220

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 12
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  9. Preface

    Gangulee, A., Ho, P. S. & Tu, K. N., Jan 1975, In: Thin Solid Films. 25, 1

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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  10. 1974
  11. Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation

    Lau, S. S., Chu, W. K., Mayer, J. W. & Tu, K. N., Sep 1974, In: Thin Solid Films. 23, 2, p. 205-213

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 58
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  12. 1972
  13. Mass transport in layered polycrystalline thin films

    Tu, K. N. & Rosenberg, R., 1 Nov 1972, In: Thin Solid Films. 13, 1, p. 163-167

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 11
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