Thin Solid Films

Thin Solid Films

ISSNs: 0040-6090

Additional searchable ISSN (Electronic): 1879-2731

Elsevier BV, Netherlands

Scopus rating (2021): CiteScore 3.9

Journal

Journal Metrics
181 - 198 out of 198Page size: 20

Research Output

  1. 1986

  2. Beading instabilities in thin film lines with bamboo microstructures

    Srolovitz, D. J. & Thompson, C. V., 15 May 1986, In: Thin Solid Films. 139, 2, p. 133-141

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 13
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  3. 1983

  4. Atomic motion of dopant during interfacial silicide formation

    Wittmer, M., Ting, C. Y. & Tu, K. N., 17 Jun 1983, In: Thin Solid Films. 104, 1-2, p. 191-195

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 13
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  5. Formation and crystallization of amorphous silicides at the interface between thin metal and amorphous silicon films

    Herd, S. R., Ahn, K. Y. & Tu, K. N., 17 Jun 1983, In: Thin Solid Films. 104, 1-2, p. 197-206

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 14
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  6. Oxidation behavior of PdSi compounds

    Cros, A., Pollak, R. A. & Tu, K. N., 17 Jun 1983, In: Thin Solid Films. 104, 1-2, p. 221-225

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 30
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  7. 1982

  8. Comparison of the three classes (rare earth, refractory and near-noble) of silicide contacts

    Thompson, R. D. & Tu, K. N., 23 Jul 1982, In: Thin Solid Films. 93, 3-4, p. 265-274

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 54
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  9. Formation and structure of epitaxial NiSi2 and CoSi2

    Chen, L. J., Mayer, J. W. & Tu, K. N., 9 Jul 1982, In: Thin Solid Films. 93, 1-2, p. 135-141

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 58
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  10. Lattice imaging of silicide-silicon interfaces

    Chen, L. J., Mayer, J. W., Tu, K. N. & Sheng, T. T., 9 Jul 1982, In: Thin Solid Films. 93, 1-2, p. 91-97

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 37
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  11. Preface

    Ho, P. S. & Tu, K. N., 9 Jul 1982, In: Thin Solid Films. 93, 1-2

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  12. Tracer diffusion in amorphous Pd80Si20 and Gd16Co84 films

    Gupta, D., Tu, K. N. & Asai, K. W., 16 Apr 1982, In: Thin Solid Films. 90, 2, p. 131-137

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 6
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  13. Low temperature doping of arsenic atoms in silicon during Pd2Si formation

    Ohdomari, I., Suguro, K., Akiyama, M., Maeda, T., Tu, K. N., Kimura, I. & Yoneda, K., 26 Mar 1982, In: Thin Solid Films. 89, 4, p. 349-354

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 9
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  14. 1981

  15. Germanide formation by thermal treatment of platinum films deposited on single-crystal Ge〈100〉 substrates

    Grimaldi, M. G., Wieluński, L., Nicolet, M. A. & Tu, K. N., 24 Jul 1981, In: Thin Solid Films. 81, 3, p. 207-211

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 30
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  16. 1978

  17. Contact reactions between amorphous silicon and single-crystal metallic films

    Köster, U., Campbell, D. R. & Tu, K. N., 1 Sep 1978, In: Thin Solid Films. 53, 2, p. 129-134

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 15
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  18. 1975

  19. Implanted noble gas atoms as diffusion markers in silicide formation

    Chu, W. K., Lau, S. S., Mayer, J. W., Müller, H. & Tu, K. N., Feb 1975, In: Thin Solid Films. 25, 2, p. 393-402

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 229
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  20. Structure and growth kinetics of Ni2Si on silicon

    Tu, K. N., Chu, W. K. & Mayer, J. W., Feb 1975, In: Thin Solid Films. 25, 2, p. 403-413

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 185
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  21. Diffusion of arsenic along dislocations in epitaxial silicon films

    Campbell, D. R., Tu, K. N. & Schwenker, R. O., Jan 1975, In: Thin Solid Films. 25, 1, p. 213-220

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 12
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  22. Preface

    Gangulee, A., Ho, P. S. & Tu, K. N., Jan 1975, In: Thin Solid Films. 25, 1

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Editorial Preface

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  23. 1974

  24. Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation

    Lau, S. S., Chu, W. K., Mayer, J. W. & Tu, K. N., Sep 1974, In: Thin Solid Films. 23, 2, p. 205-213

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 57
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  25. 1972

  26. Mass transport in layered polycrystalline thin films

    Tu, K. N. & Rosenberg, R., 1 Nov 1972, In: Thin Solid Films. 13, 1, p. 163-167

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 11
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