Semiconductor Science and Technology

Semiconductor Science and Technology

ISSNs: 0268-1242

Additional searchable ISSN (electronic): 1361-6641

Institute of Physics Publishing Ltd., United Kingdom

Scopus rating (2023): CiteScore 4.3 SJR 0.411 SNIP 0.741

Journal

Journal Metrics
1 - 20 out of 24Page size: 20

Research Output

  1. 2020
  2. Published

    A MoSSe/blue phosphorene vdw heterostructure with energy conversion efficiency of 19.9% for photocatalytic water splitting

    Luo, Y., Wang, S., Shu, H., Chou, J., Ren, K., Yu, J. & Sun, M., Dec 2020, In: Semiconductor Science and Technology. 35, 12, 125008.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 69
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  3. 2019
  4. Published

    Mg induced compositional change in InGaN alloys

    Gherasoiu, I., Yu, K. M., Hawkridge, M., Reichertz, L. A. & Walukiewicz, W., Feb 2019, In: Semiconductor Science and Technology. 34, 2, 025014.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 3
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  5. 2018
  6. Published

    THz transient photoconductivity of the III-V dilute nitride GaPy As1-y -x Nx

    Heyman, J. N., Weiss, E. M., Rollag, J. R., Yu, K. M., Dubon, O. D., Kuang, Y. J., Tu, C. W., & 1 othersWalukiewicz, W., 26 Oct 2018, In: Semiconductor Science and Technology. 33, 12, 125009.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 5
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  7. Published

    The effect of copper pretreatment on graphene synthesis by ion implantation into Ni/Cu substrate

    Hu, X., Zhang, M., Xue, Z., Dong, L., Wang, G., Wang, Y., Chu, P. K., & 2 othersWang, X. & Di, Z., Jul 2018, In: Semiconductor Science and Technology. 33, 7

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 1
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  8. 2016
  9. Published

    Highly mismatched GaN1-xSbx alloys: Synthesis, structure and electronic properties

    Yu, K. M., Sarney, W. L., Novikov, S. V., Segercrantz, N., Ting, M., Shaw, M., Svensson, S. P., & 3 othersMartin, R. W., Walukiewicz, W. & Foxon, C. T., Aug 2016, In: Semiconductor Science and Technology. 31, 8, 083001.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 18
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  10. Published

    Study on the strain in a silicon microchannel plate by micro-Raman analysis

    Xu, S., Fang, J., Wu, D., Zhang, C., Zhu, Y., Xiong, D., Wang, L., & 2 othersYang, P. & Chu, P. K., May 2016, In: Semiconductor Science and Technology. 31, 5, 055010.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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  11. 2015
  12. Published

    Effects of a semiconductor matrix on the band anticrossing in dilute group II-VI oxides

    Wełna, M., Kudrawiec, R., Nabetani, Y., Tanaka, T., Jaquez, M., Dubon, O. D., Yu, K. M., & 1 othersWalukiewicz, W., Aug 2015, In: Semiconductor Science and Technology. 30, 8, 085018.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 20
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  13. Published

    General observation of the memory effect in metal-insulator-ITO structures due to indium diffusion

    Wu, X., Xu, H., Wang, Y., Rogach, A. L., Shen, Y. & Zhao, N., 1 Jul 2015, In: Semiconductor Science and Technology. 30, 7, 74002.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 13
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  14. 2011

  15. Memory characteristics and the tunneling mechanism of Au nanocrystals embedded in a DyScO3 high-k gate dielectric layer

    Chan, K. C., Lee, P. F., Li, D. F. & Dai, J. Y., Feb 2011, In: Semiconductor Science and Technology. 26, 2, 025015.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 8
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  16. 2010

  17. Modelling of the composition segregation effect during epitaxial growth of InGaAs quantum well heterostructures

    Khazanova, S. V. & Vasilevskiy, M. I., 2 Aug 2010, In: Semiconductor Science and Technology. 25, 8, 85008.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 9
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  18. 2009
  19. Published

    The nanoscale analysis of MOSFET switching loss

    Lee, S. C. & Tsang, K. F., 2009, In: Semiconductor Science and Technology. 24, 11, 115015.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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  20. 2007

  21. Towards identification of localized donor states in InN

    Plesiewicz, J., Suski, T., Dmowski, L., Walukiewicz, W., Yu, K. M., Korman, A., Ratajczak, R., & 3 othersStonert, A., Lu, H. & Schaff, W., 1 Oct 2007, In: Semiconductor Science and Technology. 22, 10, p. 1161-1164 14.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 4
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  22. Characterization of low-temperature molecular-beam-epitaxy grown GaBiAs layers

    Pačebutas, V., Bertulis, K., Dapkus, L., Aleksejenko, G., Krotkus, A., Yu, K. M. & Walukiewicz, W., 1 Jul 2007, In: Semiconductor Science and Technology. 22, 7, p. 819-823 26.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 35
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  23. 2006
  24. Published

    Atomistic calculation of elastic moduli in strained silicon

    Zhu, R., Pan, E., Chung, P. W., Cai, X., Liew, K. M. & Buldum, A., 1 Jul 2006, In: Semiconductor Science and Technology. 21, 7, p. 906-911 14.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 89
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  25. 2005
  26. Published

    Interfacial characteristics of fully depleted SiGe-on-insulator (SGOI) substrate fabricated by modified Ge condensation

    Di, Z., Zhang, M., Liu, W., Luo, S., Song, Z., Lin, C., Lin, Q., & 1 othersChu, P. K., 1 Aug 2005, In: Semiconductor Science and Technology. 20, 8

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 2
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  27. 2004

  28. 1.3-1.5 μm electroluminescence from Schottky diodes made on Au-InAs/GaAs quantum-size heterostructures

    Baidus, N. V., Zvonkov, B. N., Mokeeva, P. B., Uskova, E. A., Tikhov, S. V., Vasilevskiy, M. I., Gomes, M. J. M., & 1 othersFilonovich, S. A., Apr 2004, In: Semiconductor Science and Technology. 19, 4 SPEC. ISS.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 13
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  29. Polaron effect on Raman scattering in semiconductor quantum dots

    Vasilevskiy, M. I., Miranda, R. P., Anda, E. V. & Makler, S. S., Apr 2004, In: Semiconductor Science and Technology. 19, 4 SPEC. ISS.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 11
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  30. 2003
  31. Published

    Room-temperature electroluminescence from H-plasma-implanted silicon

    Liu, W., Kwok, S. C., Fu, R. K., Chu, P. K., Hung, T. F., Xu, Z., Lin, C., & 3 othersLi, K. F., Tam, H. L. & Cheah, K. W., Dec 2003, In: Semiconductor Science and Technology. 18, 12

    Research output: Journal Publications and Reviews › Letter

    Scopus citations: 5
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  32. Whispering gallery mode emission from a composite system of CdTe nanocrystals and a spherical microcavity

    Rakovich, Y. P., Yang, L., McCabe, E. M., Donegan, J. F., Perova, T., Moore, A., Gaponik, N., & 1 othersRogach, A., Nov 2003, In: Semiconductor Science and Technology. 18, 11, p. 914-918

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 75
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  33. 2002

  34. Ion beam synthesis and n-type doping of group III-Nx-V1-x alloys

    Yu, K. M., Aug 2002, In: Semiconductor Science and Technology. 17, 8, p. 785-796

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 17
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