半导体学报

半导体学报

ISSNs: 0253-4177

Kexue Chubanshe, China

Scopus rating (2021)

Journal

Journal Metrics

Research Output

  1. 2007
  2. Published

    Electrical transport properties of ZnO/p-Si heterostructure

    Gu, Q., Chen, X., Ling, Z., Mei, Y., Fu, J., Xiao, J. & Zhu, J., Sep 2007, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 28, SUPPL., p. 149-152

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  3. 2006
  4. Published

    Mechanism in SiGe-on-insulator fabricated by modified Ge-condensation technique

    Zhang, M., Di, Z., Liu, W., Luo, S., Song, Z., Chu, P. K. & Lin, C., Dec 2006, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 27, SUPPL., p. 252-256

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  5. 2003
  6. Published

    Epitaxial growth of CoSi2 by Co/C/Si solid phase epitaxy

    Qu, X., Xu, B., Ru, G., Li, B., Cheung, W. Y., Wong, S. P. & Chu, P. K., Jan 2003, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 24, 1, p. 63-67

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  7. 2001
  8. SiOx mediated epitaxial ternary silicide (Co1-xNix) Si2

    Han, Y., Li, B., Ru, G., Qu, X., Cao, Y., Xu, B., Jiang, Y. & 3 others, Wang, L., Zhang, R. & Chu, P. K., Oct 2001, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 22, 10, p. 1269-1273

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  9. 1999
  10. Published

    Impurity gettering effects of helium implantation-induced cavities in silicon

    Min, J., Paul K. Chu, K. C., Lu, X., Iyer, S. S. K. & Cheung, N. W., Jun 1999, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 20, 6, p. 448-451

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  11. 1998
  12. Thermal stability improvement of ultrathin CoSi2 film formed by TiN capping layer and Co/Ti/Si ternary solid phase reaction

    Liu, J., Ru, G., Gu, Z., Qu, X., Li, B. & Zhu, J., 1998, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 19, 3, p. 214-217

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 1
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  13. 1995
  14. Theoretical study of ionic silicon clusters

    Chu, T., Zhang, R. & Dai, G., Dec 1995, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 16, 12, p. 805-810

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  15. Determination of adsorption site of H2O on Si(100) surface

    Zhang, R., Chu, T., Dai, G., Wu, J. & Xing, Y., Nov 1995, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 16, 11, p. 820-825

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  16. Influence of hydrogen adsorption on Si(113) surface

    Zhang, R., Wu, J. & Xing, Y., Nov 1995, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 16, 11, p. 815-819

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  17. Electrical and photoconductive characteristics of B-doped and undoped diamond film

    Zhang, F., Zhang, W., Hu, B., Xie, E. & Chen, G., Oct 1995, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 16, 10, p. 783-788

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 2
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  18. Published

    New development of PIII for SIMOX structure

    Min, J., Chu, P. K., Cheng, Y. C., Liu, J. B., Iyer, S. & Cheng, N. W., Aug 1995, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 16, 8, p. 636-640

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Scopus citations: 3
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  19. 1993
  20. Theoretical study of Si (112) high Miller index surface

    Zhang, R., Wu, J. & Xing, Y., Sep 1993, In: Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 14, 9, p. 527-533

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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  21. 1989
  22. Si(113)表面电子结构的研究

    张瑞勤, 王家俭, 戴国才, 吴汲安, 张敬平 & 邢益荣, Sep 1989, In: 半导体学报. 10, 9, p. 645-652

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

    Check@CityULib