Materials Letters
Materials Letters
ISSNs: 0167-577X
Additional searchable ISSN (Electronic): 1873-4979
ELSEVIER SCIENCE BV, Netherlands
Scopus rating (2021): CiteScore 6 SJR 0.658 SNIP 0.799
Journal
Research Output
- 1992
Study of influence of annealing on defects in diamond films with ESR and IR measurements
Wenjun, Z., Fangqing, Z., Quanzhong, W. & Guanghua, C., Dec 1992, In: Materials Letters. 15, 4, p. 292-297Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 19- 1990
- Published
Deformation processing map for control of microstructure in Al-4Mg alloy
Rao, K. P., Prasad, Y. V. R. K. & Sivaram, K., Sep 1990, In: Materials Letters. 10, 1-2, p. 66-70Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 9 - 1985
Interfacial reaction between amorphous silicon and palladium thin films
Hentzell, H. T. G., Psaras, P. A. & Tu, K. N., May 1985, In: Materials Letters. 3, 7-8, p. 255-260Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 4- 1983
Motion of W marker during sequential compound formation in bimetallic AlCu thin films
Hentzell, H. T. G., Thompson, R. D. & Tu, K. N., Oct 1983, In: Materials Letters. 2, 2, p. 81-84Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 10- 1982
Single intermetallic compound formation in Pd-Pb and Pd-Sn thin-film couples studied by X-ray diffraction
Tu, K. N., Jun 1982, In: Materials Letters. 1, 1, p. 6-10Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 9