Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2023): CiteScore 5.4 SJR 0.649 SNIP 0.96

Journal

Journal Metrics
121 - 140 out of 373Page size: 20

Research Output

  1. 2007

  2. Growth mechanism from nano-ordered clusters to nanocrystals in a deeply undercooled melt of Zr-Ni-Ti metallic glass

    Liu, X. J., Chen, G. L., Hui, X. D., Hou, H. Y., Yao, K. F. & Liu, C. T., 2007, In: Journal of Applied Physics. 102, 6, 63515.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 20
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  3. Hole transport in molecularly doped naphthyl diamine

    Tong, K. L., Tsang, S. W., Tsung, K. K., Tse, S. C. & So, S. K., 2007, In: Journal of Applied Physics. 102, 9, 93705.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 40
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  4. New criterion of glass forming ability for bulk metallic glasses

    Du, X. H., Huang, J. C., Liu, C. T. & Lu, Z. P., 2007, In: Journal of Applied Physics. 101, 8, 86108.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 180
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  5. Preferred orientation relationship between Cu6Sn5 scallop-type grains and Cu substrate in reactions between molten Sn-based solders and Cu

    Suh, J. O., Tu, K. N. & Tamura, N., 2007, In: Journal of Applied Physics. 102, 6, 063511.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 77
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  6. Structural transition of ferromagnetic Ni2MnGa nanoparticles

    Wang, Y. D., Ren, Y., Nie, Z. H., Liu, D. M., Zuo, L., Choo, H. & Li, H. & 5 others, Liaw, P. K., Yan, J. Q., McQueeney, R. J., Richardson, J. W. & Huq, A., 2007, In: Journal of Applied Physics. 101, 6, 063530.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 63
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  7. Three-dimensional structure of CdX (X=Se,Te) nanocrystals by total x-ray diffraction

    Pradhan, S. K., Deng, Z. T., Tang, F., Wang, C., Ren, Y., Moeck, P. & Petkov, V., 2007, In: Journal of Applied Physics. 102, 4, 044304.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 15
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  8. 2006

  9. Modeling of smoothening effect on morphologies of annealed submicron nickel particles used for electrically conductive adhesives

    Goh, C. F., Gan, Z. H., Mhaisalkar, S. G., Boey, F. Y. C., Gusak, A. M. & Teo, P. S., 15 Oct 2006, In: Journal of Applied Physics. 100, 8, 084302.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 3
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  10. Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches

    Kim, J. H., Srolovitz, D. J., Cha, P.-R. & Yoon, J.-K., 1 Sept 2006, In: Journal of Applied Physics. 100, 5, 054502.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 8
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  11. Film/substrate interface stability in thin films

    Krishnamurthy, R. & Srolovitz, D. J., 15 Feb 2006, In: Journal of Applied Physics. 99, 4, 043504.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 10
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  12. Electromigration in Pb-free flip chip solder joints on flexible substrates

    Nah, J. W., Ren, F., Tu, K. N., Venk, S. & Camara, G., 15 Jan 2006, In: Journal of Applied Physics. 99, 2, 023520.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 39
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  13. Application of admittance spectroscopy to evaluate carrier mobility in organic charge transport materials

    Tsang, S. W., So, S. K. & Xu, J. B., 2006, In: Journal of Applied Physics. 99, 1, 13706.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 235
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  14. Effect of the combination of electromigration and thermomigration on phase migration and partial melting in flip chip composite SnPb solder joints

    Huang, A. T., Tu, K. N. & Lai, Y.-S., 2006, In: Journal of Applied Physics. 100, 3, 033512.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 55
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  15. Electromigration and critical product in eutectic SnPb solder lines at 100°C

    Agarwal, R., Ou, S. E. & Tu, K. N., 2006, In: Journal of Applied Physics. 100, 2, 024909.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 36
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  16. Electromigration in flip chip solder joints having a thick Cu column bump and a shallow solder interconnect

    Nah, J.-W., Suh, J. O., Tu, K. N., Yoon, S. W., Rao, V. S., Kripesh, V. & Hua, F., 2006, In: Journal of Applied Physics. 100, 12, 123513.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 98
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  17. Examining the oxygen isotope and magnetic field effect on phase separation in Sm0.5Sr0.5MnO3

    Styka, A. N., Ren, Y., Gorbenko, O. Y., Babushkina, N. A. & Brown, D. E., 2006, In: Journal of Applied Physics. 100, 10, 103520.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 9
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  18. Polymeric conducting anode for small organic transporting molecules in dark injection experiments

    Tse, S. C., Tsang, S. W. & So, S. K., 2006, In: Journal of Applied Physics. 100, 6, 63708.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 87
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  19. Structural properties of Ge nanocrystals embedded in sapphire

    Sharp, I. D., Xu, Q., Yi, D. O., Yuan, C. W., Beeman, J. W., Yu, K. M. & Ager III, J. W. & 2 others, Chrzan, D. C. & Haller, E. E., 2006, In: Journal of Applied Physics. 100, 11, 114317.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 25
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  20. 2005

  21. Three-dimensional simulation of void migration at the interface between thin metallic film and dielectric under electromigration

    Zaporozhets, T. V., Gusak, A. M., Tu, K. N. & Mhaisalkar, S. G., 15 Nov 2005, In: Journal of Applied Physics. 98, 10, 103508.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 35
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  22. Effects of stoichiometry on electrical, optical, and structural properties of indium nitride

    Ho, J. C., Specht, P., Yang, Q., Xu, X., Hao, D. & Weber, E. R., 1 Nov 2005, In: Journal of Applied Physics. 98, 9, 093712.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 28
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  23. Bismuth replacement by samarium in strontium bismuth niobate and its multiferroic nature

    Srinivas, A., Sritharan, T. & Boey, F. Y. C., 1 Aug 2005, In: Journal of Applied Physics. 98, 3, 036104.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 16
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