Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (Electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2021): CiteScore 4.7 SJR 0.668 SNIP 0.964

Journal

Journal Metrics
101 - 120 out of 353Page size: 20

Research Output

  1. 2007

  2. Nanospot welding and contact evolution during cycling of a model microswitch

    Doelling, C. M., Kyle Vanderlick, T., Song, J. & Srolovitz, D., 18 Jun 2007, In: Journal of Applied Physics. 101, 12, 124303.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 13
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  3. Very high-cycle fatigue failure in micron-scale polycrystalline silicon films: Effects of environment and surface oxide thickness

    Alsem, D. H., Timmerman, R., Boyce, B. L., Stach, E. A., De Hosson, J. T. M. & Ritchie, R. O., 1 Jan 2007, In: Journal of Applied Physics. 101, 1, 013515.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 54
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  4. Electron mobility in InN and III-N alloys

    Hsu, L., Jones, R. E., Li, S. X., Yu, K. M. & Walukiewicz, W., 2007, In: Journal of Applied Physics. 102, 7, 73705.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 52
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  5. Growth mechanism from nano-ordered clusters to nanocrystals in a deeply undercooled melt of Zr-Ni-Ti metallic glass

    Liu, X. J., Chen, G. L., Hui, X. D., Hou, H. Y., Yao, K. F. & Liu, C. T., 2007, In: Journal of Applied Physics. 102, 6, 63515.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 18
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  6. Hole transport in molecularly doped naphthyl diamine

    Tong, K. L., Tsang, S. W., Tsung, K. K., Tse, S. C. & So, S. K., 2007, In: Journal of Applied Physics. 102, 9, 93705.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 39
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  7. New criterion of glass forming ability for bulk metallic glasses

    Du, X. H., Huang, J. C., Liu, C. T. & Lu, Z. P., 2007, In: Journal of Applied Physics. 101, 8, 86108.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 158
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  8. Preferred orientation relationship between Cu6Sn5 scallop-type grains and Cu substrate in reactions between molten Sn-based solders and Cu

    Suh, J. O., Tu, K. N. & Tamura, N., 2007, In: Journal of Applied Physics. 102, 6, 063511.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 74
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  9. Structural transition of ferromagnetic Ni2MnGa nanoparticles

    Wang, Y. D., Ren, Y., Nie, Z. H., Liu, D. M., Zuo, L., Choo, H., Li, H., & 5 othersLiaw, P. K., Yan, J. Q., McQueeney, R. J., Richardson, J. W. & Huq, A., 2007, In: Journal of Applied Physics. 101, 6, 063530.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 57
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  10. Three-dimensional structure of CdX (X=Se,Te) nanocrystals by total x-ray diffraction

    Pradhan, S. K., Deng, Z. T., Tang, F., Wang, C., Ren, Y., Moeck, P. & Petkov, V., 2007, In: Journal of Applied Physics. 102, 4, 044304.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 14
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  11. 2006

  12. Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches

    Kim, J. H., Srolovitz, D. J., Cha, P. & Yoon, J., 1 Sep 2006, In: Journal of Applied Physics. 100, 5, 054502.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 7
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  13. Film/substrate interface stability in thin films

    Krishnamurthy, R. & Srolovitz, D. J., 15 Feb 2006, In: Journal of Applied Physics. 99, 4, 043504.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 7
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  14. Electromigration in Pb-free flip chip solder joints on flexible substrates

    Nah, J. W., Ren, F., Tu, K. N., Venk, S. & Camara, G., 15 Jan 2006, In: Journal of Applied Physics. 99, 2, 023520.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 37
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  15. Application of admittance spectroscopy to evaluate carrier mobility in organic charge transport materials

    Tsang, S. W., So, S. K. & Xu, J. B., 2006, In: Journal of Applied Physics. 99, 1, 13706.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 224
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  16. Effect of the combination of electromigration and thermomigration on phase migration and partial melting in flip chip composite SnPb solder joints

    Huang, A. T., Tu, K. N. & Lai, Y., 2006, In: Journal of Applied Physics. 100, 3, 033512.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 54
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  17. Electromigration and critical product in eutectic SnPb solder lines at 100°C

    Agarwal, R., Ou, S. E. & Tu, K. N., 2006, In: Journal of Applied Physics. 100, 2, 024909.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 34
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  18. Electromigration in flip chip solder joints having a thick Cu column bump and a shallow solder interconnect

    Nah, J., Suh, J. O., Tu, K. N., Yoon, S. W., Rao, V. S., Kripesh, V. & Hua, F., 2006, In: Journal of Applied Physics. 100, 12, 123513.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 98
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  19. Examining the oxygen isotope and magnetic field effect on phase separation in Sm0.5Sr0.5MnO3

    Styka, A. N., Ren, Y., Gorbenko, O. Y., Babushkina, N. A. & Brown, D. E., 2006, In: Journal of Applied Physics. 100, 10, 103520.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 9
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  20. Polymeric conducting anode for small organic transporting molecules in dark injection experiments

    Tse, S. C., Tsang, S. W. & So, S. K., 2006, In: Journal of Applied Physics. 100, 6, 63708.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 82
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  21. Structural properties of Ge nanocrystals embedded in sapphire

    Sharp, I. D., Xu, Q., Yi, D. O., Yuan, C. W., Beeman, J. W., Yu, K. M., Ager III, J. W., & 2 othersChrzan, D. C. & Haller, E. E., 2006, In: Journal of Applied Physics. 100, 11, 114317.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 24
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  22. 2005

  23. Three-dimensional simulation of void migration at the interface between thin metallic film and dielectric under electromigration

    Zaporozhets, T. V., Gusak, A. M., Tu, K. N. & Mhaisalkar, S. G., 15 Nov 2005, In: Journal of Applied Physics. 98, 10, 103508.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 33
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