Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (Electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2021): CiteScore 4.7 SJR 0.668 SNIP 0.964

Journal

Journal Metrics
61 - 80 out of 353Page size: 20

Research Output

  1. 2010

  2. Heat flow model for pulsed laser melting and rapid solidification of ion implanted GaAs

    Kim, T., Pillai, M. R., Aziz, M. J., Scarpulla, M. A., Dubon, O. D., Yu, K. M., Beeman, J. W., & 1 othersRidgway, M. C., 1 Jul 2010, In: Journal of Applied Physics. 108, 1, 13508.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 16
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  3. Fermi level stabilization energy in cadmium oxide

    Speaks, D. T., Mayer, M. A., Yu, K. M., Mao, S. S., Haller, E. E. & Walukiewicz, W., 1 Jun 2010, In: Journal of Applied Physics. 107, 11, 113706.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 60
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  4. Hole transport and photoluminescence in Mg-doped InN

    Miller, N., Ager III, J. W., Smith, H. M., Mayer, M. A., Yu, K. M., Haller, E. E., Walukiewicz, W., & 4 othersSchaff, W. J., Gallinat, C., Koblmüller, G. & Speck, J. S., 1 Jun 2010, In: Journal of Applied Physics. 107, 11, 113712.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 64
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  5. Erratum: "Dielectric function of hydrogenated amorphous silicon near the optical absorption edge" [J. Appl. Phys. 106, 073110 (2009)]

    Malainho, E., Vasilevskiy, M. I., Alpuim, P. & Filonovich, S. A., 15 May 2010, In: Journal of Applied Physics. 107, 10, 109903.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Erratum

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  6. Blocking hillock and whisker growth by intermetallic compound formation in Sn-0.7Cu flip chip solder joints under electromigration

    Liang, S. W., Chen, C., Han, J. K., Xu, L., Tu, K. N. & Lai, Y., 1 May 2010, In: Journal of Applied Physics. 107, 9, 093715.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 17
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  7. High precision thermal stress study on flip chips by synchrotron polychromatic x-ray microdiffraction

    Chen, K., Tamura, N., Tang, W., Kunz, M., Chou, Y., Tu, K. N. & Lai, Y., 2010, In: Journal of Applied Physics. 107, 6, 063502.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 18
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  8. 2009

  9. Surface profile-controlled close-packed Si nanorod arrays for self-cleaning antireflection coatings

    Lin, Y., Wang, H., Lin, C. & He, J., 1 Dec 2009, In: Journal of Applied Physics. 106, 11, 114310.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 50
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  10. Effect of pretreatment bias on the nucleation and growth mechanisms of ultrananocrystalline diamond films via bias-enhanced nucleation and growth: An approach to interfacial chemistry analysis via chemical bonding mapping

    Zhong, X. Y., Chen, Y. C., Tai, N. H., Lin, I. N., Hiller, J. M. & Auciello, O., 1 Feb 2009, In: Journal of Applied Physics. 105, 3, 034311.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 29
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  11. A quantitative link between microplastic instability and macroscopic deformation behaviors in metallic glasses

    Wu, Y., Chen, G. L., Hui, X. D., Liu, C. T., Lin, Y., Shang, X. C. & Lu, Z. P., 2009, In: Journal of Applied Physics. 106, 8, 83512.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 12
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  12. Characterization of nonlinear absorption of InN epitaxial films with femtosecond pulsed transmission Z -scan measurements

    Tsai, T., Wu, T., Liao, J., Wei, T., Chiang, H., Hwang, J., Tsai, D., & 1 othersChen, Y., 2009, In: Journal of Applied Physics. 105, 6, 066101.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 8
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  13. Dielectric function of hydrogenated amorphous silicon near the optical absorption edge

    Malainho, E., Vasilevskiy, M. I., Alpuim, P. & Filonovich, S. A., 2009, In: Journal of Applied Physics. 106, 7, 73110.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 15
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  14. Electron-beam irradiation induced conductivity in ZnS nanowires as revealed by in situ transmission electron microscope

    Liu, B., Bando, Y., Wang, M., Zhi, C., Fang, X., Tang, C., Mitome, M., & 1 othersGolberg, D., 2009, In: Journal of Applied Physics. 106, 3, 34302.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 14
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  15. Highly mismatched crystalline and amorphous GaN1-x As x alloys in the whole composition range

    Yu, K. M., Novikov, S. V., Broesler, R., Demchenko, I. N., Denlinger, J. D., Liliental-Weber, Z., Luckert, F., & 3 othersMartin, R. W., Walukiewicz, W. & Foxon, C. T., 2009, In: Journal of Applied Physics. 106, 10, 103709.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 61
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  16. High- TC superconductivity related to deep inner orbital coupling in FeAs-based compounds

    Chen, N., Liu, Y., Zhang, W. J. & Li, Y., 2009, In: Journal of Applied Physics. 105, 7, 07E317.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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  17. In situ measurement of electromigration-induced transient stress in Pb-free Sn-Cu solder joints by synchrotron radiation based x-ray polychromatic microdiffraction

    Chen, K., Tamura, N., Kunz, M., Tu, K. N. & Lai, Y., 2009, In: Journal of Applied Physics. 106, 2, 023502.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 28
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  18. In situ measurements of stress evolution for nanotwin formation during pulse electrodeposition of copper

    Xu, D., Sriram, V., Ozolins, V., Yang, J., Tu, K. N., Stafford, G. R. & Beauchamp, C., 2009, In: Journal of Applied Physics. 105, 2, 023521.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 68
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  19. Structural, magnetic, and transport properties of laser-annealed GaAs: Mn-H

    Farshchi, R., Hwang, D. J., Misra, N., Julaton, C. C., Yu, K. M., Grigoropoulos, C. P. & Dubon, O. D., 2009, In: Journal of Applied Physics. 106, 1, 13904.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 4
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  20. Thermophysical properties of highly doped Si and Ge melts under microgravity

    Chathoth, S. M., Damaschke, B., Samwer, K. & Schneider, S., 2009, In: Journal of Applied Physics. 106, 10, 103524.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 5
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  21. 2008

  22. Mechanism for material transfer in asperity contact

    Song, J. & Srolovitz, D. J., 15 Dec 2008, In: Journal of Applied Physics. 104, 12, 124312.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 29
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  23. Asperity contacts at the nanoscale: Comparison of Ru and Au

    Fortini, A., Mendelev, M. I., Buldyrev, S. & Srolovitz, D., 1 Oct 2008, In: Journal of Applied Physics. 104, 7, 074320.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

    Scopus citations: 45
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