Journal of Applied Physics
Journal of Applied Physics
ISSNs: 0021-8979
Additional searchable ISSN (Electronic): 1089-7550
AMER INST PHYSICS, United States
Scopus rating (2021): CiteScore 4.7 SJR 0.668 SNIP 0.964
Journal
Research Output
- 2010
Heat flow model for pulsed laser melting and rapid solidification of ion implanted GaAs
Kim, T., Pillai, M. R., Aziz, M. J., Scarpulla, M. A., Dubon, O. D., Yu, K. M., Beeman, J. W., & 1 others , 1 Jul 2010, In: Journal of Applied Physics. 108, 1, 13508.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 16Fermi level stabilization energy in cadmium oxide
Speaks, D. T., Mayer, M. A., Yu, K. M., Mao, S. S., Haller, E. E. & Walukiewicz, W., 1 Jun 2010, In: Journal of Applied Physics. 107, 11, 113706.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 60Hole transport and photoluminescence in Mg-doped InN
Miller, N., Ager III, J. W., Smith, H. M., Mayer, M. A., Yu, K. M., Haller, E. E., Walukiewicz, W., & 4 others , 1 Jun 2010, In: Journal of Applied Physics. 107, 11, 113712.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 64Erratum: "Dielectric function of hydrogenated amorphous silicon near the optical absorption edge" [J. Appl. Phys. 106, 073110 (2009)]
Malainho, E., Vasilevskiy, M. I., Alpuim, P. & Filonovich, S. A., 15 May 2010, In: Journal of Applied Physics. 107, 10, 109903.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › Erratum
Blocking hillock and whisker growth by intermetallic compound formation in Sn-0.7Cu flip chip solder joints under electromigration
Liang, S. W., Chen, C., Han, J. K., Xu, L., Tu, K. N. & Lai, Y., 1 May 2010, In: Journal of Applied Physics. 107, 9, 093715.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 17High precision thermal stress study on flip chips by synchrotron polychromatic x-ray microdiffraction
Chen, K., Tamura, N., Tang, W., Kunz, M., Chou, Y., Tu, K. N. & Lai, Y., 2010, In: Journal of Applied Physics. 107, 6, 063502.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 18- 2009
Surface profile-controlled close-packed Si nanorod arrays for self-cleaning antireflection coatings
Lin, Y., Wang, H., Lin, C. & He, J., 1 Dec 2009, In: Journal of Applied Physics. 106, 11, 114310.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 50Effect of pretreatment bias on the nucleation and growth mechanisms of ultrananocrystalline diamond films via bias-enhanced nucleation and growth: An approach to interfacial chemistry analysis via chemical bonding mapping
Zhong, X. Y., Chen, Y. C., Tai, N. H., Lin, I. N., Hiller, J. M. & Auciello, O., 1 Feb 2009, In: Journal of Applied Physics. 105, 3, 034311.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 29A quantitative link between microplastic instability and macroscopic deformation behaviors in metallic glasses
Wu, Y., Chen, G. L., Hui, X. D., Liu, C. T., Lin, Y., Shang, X. C. & Lu, Z. P., 2009, In: Journal of Applied Physics. 106, 8, 83512.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 12Characterization of nonlinear absorption of InN epitaxial films with femtosecond pulsed transmission Z -scan measurements
Tsai, T., Wu, T., Liao, J., Wei, T., Chiang, H., Hwang, J., Tsai, D., & 1 others , 2009, In: Journal of Applied Physics. 105, 6, 066101.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 8Dielectric function of hydrogenated amorphous silicon near the optical absorption edge
Malainho, E., Vasilevskiy, M. I., Alpuim, P. & Filonovich, S. A., 2009, In: Journal of Applied Physics. 106, 7, 73110.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 15Electron-beam irradiation induced conductivity in ZnS nanowires as revealed by in situ transmission electron microscope
Liu, B., Bando, Y., Wang, M., Zhi, C., Fang, X., Tang, C., Mitome, M., & 1 others , 2009, In: Journal of Applied Physics. 106, 3, 34302.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 14Highly mismatched crystalline and amorphous GaN1-x As x alloys in the whole composition range
Yu, K. M., Novikov, S. V., Broesler, R., Demchenko, I. N., Denlinger, J. D., Liliental-Weber, Z., Luckert, F., & 3 others , 2009, In: Journal of Applied Physics. 106, 10, 103709.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 61High- TC superconductivity related to deep inner orbital coupling in FeAs-based compounds
Chen, N., Liu, Y., Zhang, W. J. & Li, Y., 2009, In: Journal of Applied Physics. 105, 7, 07E317.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
In situ measurement of electromigration-induced transient stress in Pb-free Sn-Cu solder joints by synchrotron radiation based x-ray polychromatic microdiffraction
Chen, K., Tamura, N., Kunz, M., Tu, K. N. & Lai, Y., 2009, In: Journal of Applied Physics. 106, 2, 023502.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 28In situ measurements of stress evolution for nanotwin formation during pulse electrodeposition of copper
Xu, D., Sriram, V., Ozolins, V., Yang, J., Tu, K. N., Stafford, G. R. & Beauchamp, C., 2009, In: Journal of Applied Physics. 105, 2, 023521.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 68Structural, magnetic, and transport properties of laser-annealed GaAs: Mn-H
Farshchi, R., Hwang, D. J., Misra, N., Julaton, C. C., Yu, K. M., Grigoropoulos, C. P. & Dubon, O. D., 2009, In: Journal of Applied Physics. 106, 1, 13904.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 4Thermophysical properties of highly doped Si and Ge melts under microgravity
Chathoth, S. M., Damaschke, B., Samwer, K. & Schneider, S., 2009, In: Journal of Applied Physics. 106, 10, 103524.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 5- 2008
Mechanism for material transfer in asperity contact
Song, J. & Srolovitz, D. J., 15 Dec 2008, In: Journal of Applied Physics. 104, 12, 124312.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 29Asperity contacts at the nanoscale: Comparison of Ru and Au
Fortini, A., Mendelev, M. I., Buldyrev, S. & Srolovitz, D., 1 Oct 2008, In: Journal of Applied Physics. 104, 7, 074320.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Scopus citations: 45