Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2023): CiteScore 5.4 SJR 0.649 SNIP 0.96

Journal

Journal Metrics

Research Output

  1. 1997
  2. Polarity effect on failure of Ni and Ni2Si contacts on Si

    Huang, J. S., Tu, K. N., Bedell, S. W., Lanford, W. A., Cheng, S. L., Lai, J. B. & Chen, L. J., 1 Sept 1997, In: Journal of Applied Physics. 82, 5, p. 2370-2377

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 14
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  3. The selective etching with H+ ions and its effect on the oriented growth of diamond films

    Zhang, W. J., Jiang, X. & Xia, Y. B., 15 Aug 1997, In: Journal of Applied Physics. 82, 4, p. 1896-1899

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 41
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  4. Assessment of the theoretical basis of the Rule of Additivity for the nucleation incubation time during continuous cooling

    Zhu, Y. T., Lowe, T. C. & Asaro, R. J., 1 Aug 1997, In: Journal of Applied Physics. 82, 3, p. 1129-1137

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 16
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  5. Kinetics of Cu3Ge formation and reaction with Al

    Huang, J. S., Huang, S. S., Tu, K. N., Deng, F., Lau, S. S., Cheng, S. L. & Chen, L. J., 15 Jul 1997, In: Journal of Applied Physics. 82, 2, p. 644-649

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 7
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  6. Transmission electron microscopy on {113} rodlike defects and {111} dislocation loops in silicon-implanted silicon

    Pan, G. Z. & Tu, K. N., 15 Jul 1997, In: Journal of Applied Physics. 82, 2, p. 601-606

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 27
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  7. High temperature behavior of Pt and Pd on GaN

    Duxstad, K. J., Haller, E. E. & Yu, K. M., 1 Apr 1997, In: Journal of Applied Physics. 81, 7, p. 3134-3137

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 48
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  8. Size-distribution and annealing behavior of end-of-range dislocation loops in silicon-implanted silicon

    Pan, G. Z., Tu, K. N. & Prussin, A., 1 Jan 1997, In: Journal of Applied Physics. 81, 1, p. 78-84

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 59
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  9. 1996
  10. A two-dimensional molecular dynamics simulation of thin film growth by oblique deposition

    Dong, L., Smith, R. W. & Srolovitz, D. J., 15 Nov 1996, In: Journal of Applied Physics. 80, 10, p. 5682-5690

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 120
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  11. Amphoteric behavior and precipitation of Ge dopants in InP

    Yu, K. M., Moll, A. J. & Walukiewicz, W., 1 Nov 1996, In: Journal of Applied Physics. 80, 9, p. 4907-4915

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 5
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  12. Morphology of wetting reaction of eutectic SnPb solder on Au foils

    Kim, P. G. & Tu, K. N., 1 Oct 1996, In: Journal of Applied Physics. 80, 7, p. 3822-3827

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 77
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  13. Spalling of Cu6Sn5 spheroids in the soldering reaction of eutectic SnPb on Cr/Cu/Au thin films

    Liu, A. A., Kim, H. K., Tu, K. N. & Totta, P. A., 1 Sept 1996, In: Journal of Applied Physics. 80, 5, p. 2774-2780

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 125
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  14. Electrical activation and local structure of Se atoms in ion-implanted indium phosphide

    Yu, K. M., Chan, N. & Hsu, L., 1 Jun 1996, In: Journal of Applied Physics. 79, 11, p. 8445-8450

    Research output: Journal Publications and ReviewsRGC 62 - Review of books or of software (or similar publications/items)peer-review

    Scopus citations: 2
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  15. Morphological stability of a heterophase interface under electromigration conditions

    Klinger, L., Levin, L. & Srolovitz, D., 1 May 1996, In: Journal of Applied Physics. 79, 9, p. 6834-6839

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 22
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  16. Electron spectroscopic studies of colossal magnetoresistance material La1-xCaxMnO3

    Park, J. -., Chen, C. T., Cheong, S., Bao, W., Meigs, G., Chakarian, V. & Idzerda, Y. U., 15 Apr 1996, In: Journal of Applied Physics. 79, 8, p. 4558-4560

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 18
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  17. Strong magnetic fluctuations in transition metal oxides (invited)

    Broholm, C., Aeppli, G., Lee, S., Bao, W. & DiTusa, J. F., 15 Apr 1996, In: Journal of Applied Physics. 79, 8, p. 5023-5028

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 12
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  18. Void formation during film growth: A molecular dynamics simulation study

    Smith, R. W. & Srolovitz, D. J., 1 Feb 1996, In: Journal of Applied Physics. 79, 3, p. 1448-1457

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 149
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  19. 1995
  20. Fracture of synthetic diamond

    Drory, M. D., Dauskardt, R. H., Kant, A. & Ritchie, R. O., 1 Sept 1995, In: Journal of Applied Physics. 78, 5, p. 3083-3088

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 65
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  21. Investigation of reactive-ion-etch-induced damage of InP/InGaAs multiple quantum wells by photoluminescence

    Steffensen, O. M., Birkedal, D., Hanberg, J., Albrektsen, O. & Pang, S. W., 1 Aug 1995, In: Journal of Applied Physics. 78, 3, p. 1528-1532

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 12
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  22. Finite-element stress analysis of failure mechanisms in a multilevel metallization structure

    Shi, L. T. & Tu, K. N., 1995, In: Journal of Applied Physics. 77, 7, p. 3037-3041

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 19
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  23. In situ scanning electron microscope comparison studies on electromigration of Cu and Cu(Sn) alloys for advanced chip interconnects

    Lee, K. L., Hu, C. K. & Tu, K. N., 1995, In: Journal of Applied Physics. 78, 7, p. 4428-4437

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 165
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