Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2023): CiteScore 5.4 SJR 0.649 SNIP 0.96

Journal

Journal Metrics

Research Output

  1. 1999
  2. Interfacial reaction and wetting behavior in eutectic SnPb solder on Ni/Ti thin films and Ni foils

    Kim, P. G., Jang, J. W., Lee, T. Y. & Tu, K. N., Dec 1999, In: Journal of Applied Physics. 86, 12, p. 6746-6751

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 142
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  3. Roughness evolution of Cu6Sn5 intermetallic during soldering

    Zuruzi, A. S., Chiu, C. H., Lahiri, S. K. & Tu, K. N., 1 Nov 1999, In: Journal of Applied Physics. 86, 9, p. 4916-4921

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 45
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  4. Low-resistance ohmic contacts to p-type GaN achieved by the oxidation of Ni/Au films

    Ho, J., Jong, C., Chiu, C. C., Huang, C., Shih, K., Chen, L., Chen, F., & 1 othersKai, J., 15 Oct 1999, In: Journal of Applied Physics. 86, 8, p. 4491-4497

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 293
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  5. Microstructural investigation of oxidized Ni/Au ohmic contact to p-type GaN

    Chen, L., Chen, F., Kai, J., Chang, L., Ho, J., Jong, C., Chiu, C. C., & 3 othersHuang, C., Chen, C. & Shih, K., 1 Oct 1999, In: Journal of Applied Physics. 86, 7, p. 3826-3832

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 121
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  6. Thermoelectric characterization of Si thin films in silicon-on-insulator wafers

    Liao, C. N., Chen, C. & Tu, K. N., Sept 1999, In: Journal of Applied Physics. 86, 6, p. 3204-3208

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 61
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  7. Dopant activation of heavily doped silicon-on-insulator by high density currents

    Chen, C., Huang, J. S., Liao, C. N. & Tu, K. N., Aug 1999, In: Journal of Applied Physics. 86, 3, p. 1552-1557

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 8
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  8. Kinetic analysis of interfacial diffusion accompanied by intermetallic compound formation

    Kim, P. G., Jang, J. W., Tu, K. N. & Frear, D. R., Aug 1999, In: Journal of Applied Physics. 86, 3, p. 1266-1272

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 21
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  9. Dependence of the fundamental band gap of AlXGa1-XN on alloy composition and pressure

    Shan, W., Ager III, J. W., Yu, K. M., Walukiewicz, W., Haller, E. E., Martin, M. C., McKinney, W. R., & 1 othersYang, W., 15 Jun 1999, In: Journal of Applied Physics. 85, 12, p. 8505-8507

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 113
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  10. Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology

    Jang, J. W., Kim, P. G., Tu, K. N., Frear, D. R. & Thompson, P., 15 Jun 1999, In: Journal of Applied Physics. 85, 12, p. 8456-8463

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 277
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  11. Direct correlation between mechanical failure and metallurgical reaction in flip chip solder joints

    Liu, C. Y., Chen, C., Mal, A. K. & Tu, K. N., 1 Apr 1999, In: Journal of Applied Physics. 85, 7, p. 3882-3886

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 85
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  12. Chemical bonding and electronic properties of SeS2-treated GaAs(100)

    Sun, J., Seo, D. J., O'Brien, W. L., Himpsel, F. J., Ellis, A. B. & Kuech, T. F., 15 Jan 1999, In: Journal of Applied Physics. 85, 2, p. 969-977

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 29
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  13. Chain/column evolution and corresponding electrorheological effect

    Wen, W., Zheng, D. W. & Tu, K. N., Jan 1999, In: Journal of Applied Physics. 85, 1, p. 530-533

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 28
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  14. 1998
  15. Abnormal electrical behavior and phase changes in implanted p+- And n+-Si channels under high current densities

    Huang, J. S., Liao, C. N., Tu, K. N., Cheng, S. L. & Chen, L. J., 1 Nov 1998, In: Journal of Applied Physics. 84, 9, p. 4788-4796

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 9
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  16. Texture development mechanisms in ion beam assisted deposition

    Dong, L. & Srolovitz, D. J., 1 Nov 1998, In: Journal of Applied Physics. 84, 9, p. 5261-5269

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 104
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  17. Time- and temperature-dependent wetting behavior of eutectic SnPb on Cu leadframes plated with Pd/Ni and Au/Pd/Ni thin films

    Kim, P. G., Tu, K. N. & Abbott, D. C., 15 Jul 1998, In: Journal of Applied Physics. 84, 2, p. 770-775

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 28
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  18. Characterization of the local structure of amorphous GaAs produced by ion implantation

    Ridgway, M. C., Glover, C. J., Foran, G. J. & Yu, K. M., 1 May 1998, In: Journal of Applied Physics. 83, 9, p. 4610-4614

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 43
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  19. Stress relaxation and misfit dislocation nucleation in the growth of misfitting films: A molecular dynamics simulation study

    Dong, L., Schnitker, J., Smith, R. W. & Srolovitz, D. J., 1 Jan 1998, In: Journal of Applied Physics. 83, 1, p. 217-227

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 118
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  20. 1997
  21. A kinetic Monte Carlo method for the atomic-scale simulation of chemical vapor deposition: Application to diamond

    Battaile, C. C., Srolovitz, D. J. & Butler, J. E., 15 Dec 1997, In: Journal of Applied Physics. 82, 12, p. 6293-6300

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 132
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  22. Tip artifacts in atomic force microscope imaging of ion bombarded nanostructures on germanium surfaces

    Chen, Y. J., Wilson, I. H., Lee, C. S., Xu, J. B. & Yu, M. L., 1 Dec 1997, In: Journal of Applied Physics. 82, 11, p. 5859-5861

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 7
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  23. Multilayer film stability

    Sridhar, N., Rickman, J. M. & Srolovitz, D. J., 15 Nov 1997, In: Journal of Applied Physics. 82, 10, p. 4852-4859

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Scopus citations: 41
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