Journal of Applied Physics

Journal of Applied Physics

ISSNs: 0021-8979

Additional searchable ISSN (electronic): 1089-7550

AMER INST PHYSICS, United States

Scopus rating (2023): CiteScore 5.4 SJR 0.649 SNIP 0.96

Journal

Journal Metrics
261 - 262 out of 262Page size: 20

Research Output

  1. 1993
  2. Published

    Generation of interface states at the silicon/oxide interface due to hot-electron injection

    Wong, H. & Cheng, Y. C., 1993, In: Journal of Applied Physics. 74, 12, p. 7364-7368

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 36
    Check@CityULib
  3. 1991
  4. Published

    Electronic conduction mechanisms in thin oxynitride films

    Wong, H. & Cheng, Y. C., 15 Jul 1991, In: Journal of Applied Physics. 70, 2, p. 1078-1080

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 43
    Check@CityULib
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