Journal of Applied Physics
Journal of Applied Physics
ISSNs: 0021-8979
Additional searchable ISSN (electronic): 1089-7550
AMER INST PHYSICS, United States
Scopus rating (2023): CiteScore 5.4 SJR 0.649 SNIP 0.96
Journal
Research Output
- 1982
Formation of shallow silicide contacts of high Schottky barrier on Si: Alloying Pd and Pt with W versus alloying Pd and Pt with Si
Eizenberg, M. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 3, p. 1577-1585Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 44Growth kinetics of planar binary diffusion couples: "Thin-film case" versus "bulk cases"
Gösele, U. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 4, p. 3252-3260Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 509High-sensitivity silicide films for optical recording
Ahn, K. Y., Distefano, T. H., Herd, S. R., Mazzeo, N. J. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 9, p. 6360-6364Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 6Ion-beam-induced metastable Pt2Si3 phase. III. Structure and diffusion in amorphous Pt2Si3
Graczyk, J. F., Tu, K. N., Tsaur, B. Y. & Mayer, J. W., 1982, In: Journal of Applied Physics. 53, 10, p. 6772-6780Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 5Laser writing on metal-silicon bilayers for optical storage. I. Optical properties
Ahn, K. Y., Di Stefano, T. H., Mazzeo, N. J., Herd, S. R. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 5, p. 3777-3783Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 14Laser writing on silicon-metal bilayers for optical storage. II. Microscopic study
Herd, S. R., Tu, K. N., Ahn, K. Y., Di Stefano, T. H. & Mazzeo, N. J., 1982, In: Journal of Applied Physics. 53, 6, p. 4372-4378Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 9NiSi formation at the silicide/Si interface on the NiPt/Si system
Ottaviani, G., Tu, K. N., Chu, W. K., Hung, L. S. & Mayer, J. W., 1982, In: Journal of Applied Physics. 53, 7, p. 4903-4906Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 40Redistribution of As during Pd2Si formation: Ion channeling measurements
Wittmer, M., Ting, C. Y., Ohdomari, I. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 10, p. 6781-6787Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 37Schottky barrier of nonuniform contacts to n-type and p-type silicon
Thompson, R. D. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 6, p. 4285-4288Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 22Thermal stability and growth kinetics of Co2Si and CoSi in thin-film reactions
Tu, K. N., Ottaviani, G., Thompson, R. D. & Mayer, J. W., 1982, In: Journal of Applied Physics. 53, 6, p. 4406-4410Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 89Thermal stability of Pd2Si and PdSi in thin film and in bulk diffusion couples
Tu, K. N., 1982, In: Journal of Applied Physics. 53, 1, p. 428-432Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 29Titanium-tungsten contacts to Si: The effects of alloying on Schottky contact and on silicide formation
Babcock, S. E. & Tu, K. N., 1982, In: Journal of Applied Physics. 53, 10, p. 6898-6905Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 53- 1981
Cross-sectional transmission electron microscopy of silicon-silicide interfaces
Föll, F., Ho, P. S. & Tu, K. N., 1981, In: Journal of Applied Physics. 52, 1, p. 250-255Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 115Formation of shallow Schottky contacts to Si using Pt-Si and Pd-Si alloy films
Eizenberg, M., Foell, H. & Tu, K. N., 1981, In: Journal of Applied Physics. 52, 2, p. 861-868Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 37Schottky contacts of Gd-Pt and Gd-V alloys on n-Si and p-Si
Thompson, R., Eizenberg, M. & Tu, K. N., 1981, In: Journal of Applied Physics. 52, 11, p. 6763-6768Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 30Thin palladium silicide contacts to silicon
Kritzinger, S. & Tu, K. N., 1981, In: Journal of Applied Physics. 52, 1, p. 305-310Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 25- 1980
Ion-beam induced metastable Pt2Si3 phase. I. Formation, structure, and properties
Tsaur, B. Y., Mayer, J. W. & Tu, K. N., 1980, In: Journal of Applied Physics. 51, 10, p. 5326-5333Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 57Ion-beam-induced metastable Pt2Si3 phase. II. Kinetics and morphology
Tsaur, B. Y., Mayer, J. W., Graczyk, J. F. & Tu, K. N., 1980, In: Journal of Applied Physics. 51, 10, p. 5334-5341Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 23Parallel silicide contacts
Ohdomari, I. & Tu, K. N., 1980, In: Journal of Applied Physics. 51, 7, p. 3735-3739Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 197Shallow silicide contact
Tu, K. N., Hammer, W. N. & Olowolafe, J. O., 1980, In: Journal of Applied Physics. 51, 3, p. 1663-1668Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 75